Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
Da: Majestic Books, Hounslow, Regno Unito
EUR 94,01
Quantità: 1 disponibili
Aggiungi al carrelloCondizione: New. pp. 778.
Condizione: New. pp. 778 1st Edition.
EUR 92,86
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 96,02
Quantità: 1 disponibili
Aggiungi al carrelloCondizione: New. pp. 778.
EUR 104,18
Quantità: Più di 20 disponibili
Aggiungi al carrelloGebunden. Condizione: New. 89 articles organized under the following section heads: Impact of Computers on Xray Analysis. Applications of Whole Pattern Fitting: Structure Determination, Phase Identification, Lattice Parameters. Search/Match Methods, Phase Identification. Diffraction .
Da: Revaluation Books, Exeter, Regno Unito
EUR 151,13
Quantità: 2 disponibili
Aggiungi al carrelloHardcover. Condizione: Brand New. 784 pages. 10.25x7.00x1.75 inches. In Stock.
Lingua: Inglese
Editore: Springer Nature B.V. Okt 1994, 1994
ISBN 10: 0306449013 ISBN 13: 9780306449017
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 147,75
Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Neuware - 89 articles organized under the following section heads: Impact of Computers on Xray Analysis. Applications of Whole Pattern Fitting: Structure Determination, Phase Identification, Lattice Parameters. Search/Match Methods, Phase Identification. Diffraction from Single Crystals and Epitaxial Films. Xray Characterization of Films and Surface Layers. Strain and Stress Determination, Xray Fractography, Diffraction Peak Broadening Analysis. Advances in Detectors and Counting Electronics. XRD Techniques and Instrumentation, Nonambient Applications, Texture, other Applications. Xray Optics, Monochromators and Synthetic Multilayers. Total Reflection XRF Applications and Instrumentation, other XRF Techniques and Instrumentation. Mathematical Techniques in Xray Spectrometry. Geological and other Applications of XRS. Index.
Lingua: Inglese
Editore: Kluwer Academic Publishers Group, 1994
ISBN 10: 0306449013 ISBN 13: 9780306449017
Da: THE SAINT BOOKSTORE, Southport, Regno Unito
EUR 108,69
Quantità: Più di 20 disponibili
Aggiungi al carrelloHardback. Condizione: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.