Condizione: New. pp. 268.
EUR 76,27
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Aggiungi al carrelloCondizione: New. pp. 268 68:B&W 7 x 10 in or 254 x 178 mm Case Laminate on White w/Gloss Lam.
Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 79,30
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Aggiungi al carrelloCondizione: New. pp. 268.
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EUR 155,24
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Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 159,31
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Da: GreatBookPricesUK, Woodford Green, Regno Unito
EUR 160,47
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Aggiungi al carrelloCondizione: New.
Lingua: Inglese
Editore: Springer Science+Business Media, New York, 1997
ISBN 10: 030645596X ISBN 13: 9780306455964
Da: Grand Eagle Retail, Bensenville, IL, U.S.A.
Hardcover. Condizione: new. Hardcover. This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command. As with the 1993 symposium, the 1994 symposium provided a forum where scientists with a common interest in AFM, STM, and other probe microscopies could interact with one another, exchange ideas and explore the possibilities for future collaborations and working relationships. In addition to the scheduled talks and poster sessions, there was an equipment exhibit featuring the newest state-of-the-art AFM/STM microscopes, other probe microscopes, imaging hardware and software, as well as the latest microscope-related and sample preparation accessories. These were all very favorably received by the meeting's attendees. Following opening remarks by Natick's Commander, Colonel Morris E. Price, Jr., and the Technical Director, Dr. Robert W. Lewis, the symposium began with the Keynote Address given by Dr. Michael F. Crommie from Boston University. The agenda was divided into four major sessions. The papers (and posters) presented at the symposium represented a broad spectrum of topics in atomic force microscopy, scanning tunneling microscopy, and other probe microscopies. This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
Condizione: As New. Unread book in perfect condition.
Da: GreatBookPricesUK, Woodford Green, Regno Unito
EUR 180,59
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Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
Lingua: Inglese
Editore: Kluwer Boston Incorporated, 1997
ISBN 10: 030645596X ISBN 13: 9780306455964
Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
EUR 204,46
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Aggiungi al carrelloCondizione: New. Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994 Editor(s): Cohen, S.H.; Lightbody, Marcia L. Num Pages: 250 pages, biography. BIC Classification: PDND; TBC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 254 x 178 x 16. Weight in Grams: 1610. . 1997. 1997th Edition. hardcover. . . . .
EUR 174,54
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Aggiungi al carrelloCondizione: New. Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994 This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, i.
Lingua: Inglese
Editore: Springer Science+Business Media, US, 1997
ISBN 10: 030645596X ISBN 13: 9780306455964
Da: Rarewaves.com USA, London, LONDO, Regno Unito
EUR 228,56
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Aggiungi al carrelloHardback. Condizione: New. 1997 ed. This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command. As with the 1993 symposium, the 1994 symposium provided a forum where scientists with a common interest in AFM, STM, and other probe microscopies could interact with one another, exchange ideas and explore the possibilities for future collaborations and working relationships. In addition to the scheduled talks and poster sessions, there was an equipment exhibit featuring the newest state-of-the-art AFM/STM microscopes, other probe microscopes, imaging hardware and software, as well as the latest microscope-related and sample preparation accessories. These were all very favorably received by the meeting's attendees. Following opening remarks by Natick's Commander, Colonel Morris E. Price, Jr., and the Technical Director, Dr. Robert W. Lewis, the symposium began with the Keynote Address given by Dr. Michael F. Crommie from Boston University. The agenda was divided into four major sessions. The papers (and posters) presented at the symposium represented a broad spectrum of topics in atomic force microscopy, scanning tunneling microscopy, and other probe microscopies.
Lingua: Inglese
Editore: Kluwer Boston Incorporated, 1997
ISBN 10: 030645596X ISBN 13: 9780306455964
Da: Kennys Bookstore, Olney, MD, U.S.A.
Condizione: New. Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994 Editor(s): Cohen, S.H.; Lightbody, Marcia L. Num Pages: 250 pages, biography. BIC Classification: PDND; TBC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 254 x 178 x 16. Weight in Grams: 1610. . 1997. 1997th Edition. hardcover. . . . . Books ship from the US and Ireland.
Lingua: Inglese
Editore: Springer Science+Business Media, US, 1997
ISBN 10: 030645596X ISBN 13: 9780306455964
Da: Rarewaves.com UK, London, Regno Unito
EUR 216,91
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Aggiungi al carrelloHardback. Condizione: New. 1997 ed. This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command. As with the 1993 symposium, the 1994 symposium provided a forum where scientists with a common interest in AFM, STM, and other probe microscopies could interact with one another, exchange ideas and explore the possibilities for future collaborations and working relationships. In addition to the scheduled talks and poster sessions, there was an equipment exhibit featuring the newest state-of-the-art AFM/STM microscopes, other probe microscopes, imaging hardware and software, as well as the latest microscope-related and sample preparation accessories. These were all very favorably received by the meeting's attendees. Following opening remarks by Natick's Commander, Colonel Morris E. Price, Jr., and the Technical Director, Dr. Robert W. Lewis, the symposium began with the Keynote Address given by Dr. Michael F. Crommie from Boston University. The agenda was divided into four major sessions. The papers (and posters) presented at the symposium represented a broad spectrum of topics in atomic force microscopy, scanning tunneling microscopy, and other probe microscopies.
EUR 242,88
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Aggiungi al carrelloBuch. Condizione: Neu. Neuware - This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command. As with the 1993 symposium, the 1994 symposium provided a forum where scientists with a common interest in AFM, STM, and other probe microscopies could interact with one another, exchange ideas and explore the possibilities for future collaborations and working relationships. In addition to the scheduled talks and poster sessions, there was an equipment exhibit featuring the newest state-of-the-art AFM/STM microscopes, other probe microscopes, imaging hardware and software, as well as the latest microscope-related and sample preparation accessories. These were all very favorably received by the meeting's attendees. Following opening remarks by Natick's Commander, Colonel Morris E. Price, Jr., and the Technical Director, Dr. Robert W. Lewis, the symposium began with the Keynote Address given by Dr. Michael F. Crommie from Boston University. The agenda was divided into four major sessions. The papers (and posters) presented at the symposium represented a broad spectrum of topics in atomic force microscopy, scanning tunneling microscopy, and other probe microscopies.
Lingua: Inglese
Editore: Springer Science+Business Media, New York, 1997
ISBN 10: 030645596X ISBN 13: 9780306455964
Da: AussieBookSeller, Truganina, VIC, Australia
EUR 318,20
Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: new. Hardcover. This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command. As with the 1993 symposium, the 1994 symposium provided a forum where scientists with a common interest in AFM, STM, and other probe microscopies could interact with one another, exchange ideas and explore the possibilities for future collaborations and working relationships. In addition to the scheduled talks and poster sessions, there was an equipment exhibit featuring the newest state-of-the-art AFM/STM microscopes, other probe microscopes, imaging hardware and software, as well as the latest microscope-related and sample preparation accessories. These were all very favorably received by the meeting's attendees. Following opening remarks by Natick's Commander, Colonel Morris E. Price, Jr., and the Technical Director, Dr. Robert W. Lewis, the symposium began with the Keynote Address given by Dr. Michael F. Crommie from Boston University. The agenda was divided into four major sessions. The papers (and posters) presented at the symposium represented a broad spectrum of topics in atomic force microscopy, scanning tunneling microscopy, and other probe microscopies. This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.