9780331258455 - retroreflectance map service for coefficient of luminous intensity (classic reprint) di eckerle, kenneth l. (3 risultati)
- Brossura
Da: PBShop.store US, Wood Dale, IL, U.S.A.PBShop.store US
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 24,71
Spedizione gratuitaSpedito in U.S.A.Quantità: 15 disponibili
PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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Da: PBShop.store UK, Fairford, GLOS, Regno UnitoPBShop.store UK
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 24,79
EUR 3,85 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 15 disponibili
PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
Altre immagini- Brossura
- Print on Demand
Da: Forgotten Books, London, Regno UnitoForgotten Books
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 15,77
Spedizione gratuitaSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Paperback. Condizione: New. Print on Demand. This book delves into the crucial area of retroreflectance measurement, a fundamental aspect of optics with wide-ranging applications in various fields, from automotive safety to scientific research. The author meticulously examines the challenges associated with achieving accurate re…troreflectance measurements, highlighting the discrepancies that often arise between different laboratories. Through a detailed exploration of the "Measurement Assurance Program" (MAP), the book unveils a practical methodology for ensuring measurement consistency and accuracy across diverse scientific settings. The author meticulously dissects the intricacies of the MAP package, which includes various retroreflectors and filters, designed to meticulously assess the capabilities of measurement apparatuses. The book provides a step-by-step guide to conducting these assessments, offering invaluable insights into the potential sources of error, including geometrical variations, aperture discrepancies, and spectral inconsistencies. By meticulously analyzing the data obtained from a series of pilot studies conducted in collaboration with industrial laboratories, the author sheds light on the complex interplay of factors influencing the precision of retroreflectance measurements. The book unveils a comprehensive approach to error analysis, outlining the uncertainties inherent in the MAP procedure and the factors that must be carefully considered when interpreting results. This book is essential reading for scientists, engineers, and technicians working in fields where precise retroreflectance measurements are paramount, providing a comprehensive framework for establishing robust and accurate measurement protocols. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item.
