9780365160144 - methods of measurement for semiconductor materials, process control, and devices: quarterly report, october 1 to december 31, 1969 (classic reprint) di bullis, w. murray (3 risultati)
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Da: PBShop.store US, Wood Dale, IL, U.S.A.PBShop.store US
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EUR 24,98
Spedizione gratuitaSpedito in U.S.A.Quantità: 15 disponibili
PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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Da: PBShop.store UK, Fairford, GLOS, Regno UnitoPBShop.store UK
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 24,85
EUR 3,85 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 15 disponibili
PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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- Print on Demand
Da: Forgotten Books, London, Regno UnitoForgotten Books
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EUR 15,69
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Paperback. Condizione: New. Print on Demand. This book presents an in-depth study of methods for measuring semiconductors, process control, and devices. Written by the author as an expansion of a quarterly report to project sponsors, the book covers the development of methods for improving semiconductor performance, interchangea…bility, and reliability. The author provides an easily applicable guide to the measurement of material properties. This book is a useful resource for engineers and researchers working with semiconductors. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item.
