9780365302025 - methods of measurement for semiconductor materials, process control, and devices: quarterly report, january 1 to march 30, 1972 (classic reprint) di bullis, w. murray (3 risultati)
- Brossura
Da: PBShop.store US, Wood Dale, IL, U.S.A.PBShop.store US
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 24,68
Spedizione gratuitaSpedito in U.S.A.Quantità: 15 disponibili
PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
- Brossura
Da: PBShop.store UK, Fairford, GLOS, Regno UnitoPBShop.store UK
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 24,78
EUR 3,85 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 15 disponibili
PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
- Brossura
- Print on Demand
Da: Forgotten Books, London, Regno UnitoForgotten Books
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 15,62
Spedizione gratuitaSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Paperback. Condizione: New. Print on Demand. This book delves into the field of methods of measurement for semiconductor materials, process control, and devices. It encompasses a wide range of topics, including resistivity, gold-doped silicon, infrared methods, die attachment evaluation, thermal properties of devices, microwave…device measurements, and carrier transport in junction devices. The author, an expert in the field, provides a comprehensive overview of the current state of the art in these areas. The book is highly technical and assumes a strong background in semiconductor physics and measurement techniques. It is primarily intended for researchers, engineers, and scientists working in the semiconductor industry or in related fields. The insights presented in this book are essential for advancing the development and manufacturing of high-quality semiconductor devices. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item.
