9780365536581 - methods of measurement for semiconductor materials, process control, and devices: quarterly report, october 1 to december 31, 1972 (classic reprint) di bullis, w. murray (3 risultati)
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PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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Da: PBShop.store UK, Fairford, GLOS, Regno UnitoPBShop.store UK
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PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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Da: Forgotten Books, London, Regno UnitoForgotten Books
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Paperback. Condizione: New. Print on Demand. This book presents a detailed study of how defects in semiconductor materials and devices affect the performance, interchangeability, and reliability of discrete semiconductor devices and integrated circuits. The author explores established measurement methods while seeking to improve… existing techniques and create new ones for the more reliable detection of defects that may lead to device failure. By focusing on the electrical properties of bulk silicon wafers, and the characterization of generation-recombination-trapping centers in silicon, the text provides valuable insights into controlling device fabrication. The author also examines gold-doped silicon and the use of infrared methods for detecting and counting impurity and defect centers in semiconductors, offering a comprehensive study from materials to methods. This book is an essential resource for professionals and researchers in the semiconductor industry, providing a deeper understanding of the factors influencing device performance and the techniques used to ensure reliability. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item.
