9780367655990 - Soft Errors: From Particles to Circuits di Autran, Jean-Luc; Munteanu, Daniela (21 risultati)

Paperback. Condizione: New. 1. The item is brand new, never used or read. It's in perfect condition and may include supplements and/or access codes or come shrink-wrapped.

Condizione: New.

Paperback. Condizione: new. Paperback. Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation.Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environmentone of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text:Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanismsDetails instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated testsDescribes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuitsExplores trends for future technological nodes and emerging devicesSoft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers. This book addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment, providing comprehensive knowledge of the complete chain of the physics of soft errors. The text discusses particle interactions with matter, soft-error mechanisms, and instrumentation developments in environme Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

Condizione: As New. Unread book in perfect condition.

Condizione: New. pp. 439.

Condizione: As New. Unread book in perfect condition.

Condizione: New.

Paperback / softback. Condizione: New. New copy - Usually dispatched within 4 working days.

Condizione: New. pp. 439.

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PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.

PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.

Paperback. Condizione: new. Paperback. Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation.Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environmentone of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text:Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanismsDetails instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated testsDescribes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuitsExplores trends for future technological nodes and emerging devicesSoft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers. This book addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment, providing comprehensive knowledge of the complete chain of the physics of soft errors. The text discusses particle interactions with matter, soft-error mechanisms, and instrumentation developments in environme Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.

Condizione: New. pp. 439.

Paperback. Condizione: New.

Paperback. Condizione: Brand New. 439 pages. 10.00x7.00x0.98 inches. In Stock.

Taschenbuch. Condizione: Neu. Soft Errors | From Particles to Circuits | Jean-Luc Autran (u. a.) | Taschenbuch | Einband - flex.(Paperback) | Englisch | 2020 | CRC Press | EAN 9780367655990 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu.

Taschenbuch. Condizione: Neu. Neuware -Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation.Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment-one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text:Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanismsDetails instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated testsDescribes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuitsExplores trends for future technological nodes and emerging devicesSoft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers. 440 pp. Englisch.

Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation.Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment-one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text:Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanismsDetails instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated testsDescribes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuitsExplores trends for future technological nodes and emerging devicesSoft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers. 440 pp. Englisch.

Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Jean-Luc Autran is distinguished professor of physics and electrical engineering at Aix-Marseille University and honorary member of the University Institute of France (IUF). He is also deputy director of the Institute for Materials, Micr.

Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation.Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment-one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text:Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanismsDetails instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated testsDescribes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuitsExplores trends for future technological nodes and emerging devicesSoft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.