Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
Condizione: Used. pp. 388.
EUR 189,82
Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Used. pp. 388 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
EUR 189,57
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Aggiungi al carrelloCondizione: Used. pp. 388.
EUR 114,07
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Aggiungi al carrelloCondizione: Sehr gut. Zustand: Sehr gut | Seiten: 370 | Sprache: Englisch | Produktart: Bücher | The European Union's directive banning the use of lead-based (Pb) solders in electronic consumer products has created an urgent need for research on solder joint behavior under various driving forces in electronic manufacturing, and for development of lead-free solders. This book provides a comprehensive examination of advanced materials reliability issues related to copper-tin reaction and electromigration in solder joints, and presents methods for preventing common reliablity problems.
Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 250,54
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
Da: Mispah books, Redhill, SURRE, Regno Unito
EUR 252,31
Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 244,86
Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Solder joints are ubiquitous in electronic consumer products. The European Union has a directive to ban the use of Pb-based solders in these products on July 1st, 2006. There is an urgent need for an increase in the research and development of Pb-free solders in electronic manufacturing. For example, spontaneous Sn whisker growth and electromigration induced failure in solder joints are serious issues. These reliability issues are quite complicated due to the combined effect of electrical, mechanical, chemical, and thermal forces on solder joints. To improve solder joint reliability, the science of solder joint behavior under various driving forces must be understood. In this book, the advanced materials reliability issues related to copper-tin reaction and electromigration in solder joints are emphasized and methods to prevent these reliability problems are discussed.
Da: moluna, Greven, Germania
EUR 199,23
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Addresses the urgent need for reliable, lead-free solders in electronic manufacturingReviews the basic science of copper-tin reactions and electromigrationEmphasizes reliability issues related to solder joint reactions and electromigration .
Lingua: Inglese
Editore: Springer New York Aug 2007, 2007
ISBN 10: 0387388907 ISBN 13: 9780387388908
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
EUR 235,39
Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Solder joints are ubiquitous in electronic consumer products. The European Union has a directive to ban the use of Pb-based solders in these products on July 1st, 2006. There is an urgent need for an increase in the research and development of Pb-free solders in electronic manufacturing. For example, spontaneous Sn whisker growth and electromigration induced failure in solder joints are serious issues. These reliability issues are quite complicated due to the combined effect of electrical, mechanical, chemical, and thermal forces on solder joints. To improve solder joint reliability, the science of solder joint behavior under various driving forces must be understood. In this book, the advanced materials reliability issues related to copper-tin reaction and electromigration in solder joints are emphasized and methods to prevent these reliability problems are discussed. 370 pp. Englisch.