Isbn: 9780444195364 - ion beam surface layer analysis;: proceedings of the international conference held on june 18-20, 1973, in yorktown heights, n.y., and sponsored by ... science foundation and the ibm corporation (1 risultati)

Hardcover. Condizione: UsedGood. Proceedings of the International Conference held on June 18-20, 1973, in Yo rktown Heights, N.Y., and Sponsored by the National Science Foundation and the IBM Corporation. Hardcover; surplus library copy with the usual stampin gs; reference number taped to spine; bar code and checkout sheet taped to f ront cover; fading and shelf wear to exterior; in good condition with clean text and tight binding.…