9780471280286 - reliability and degradation: semiconductor devices and circuits di howes, m. j.; morgan, david vernon (2 risultati)
- Rilegato
Da: -OnTimeBooks-, Phoenix, AZ, U.S.A.-OnTimeBooks-
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Buono
EUR 12,44
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibili
Condizione: good. A copy that has been read, remains in good condition. All pages are intact, and the cover is intact. The spine and cover show signs of wear. Pages can include notes and highlighting and show signs of wear, and the copy can include "From the library of" labels or previous owner inscriptions. 100% GUARANTEE! Ship…ped with delivery confirmation, if you're not satisfied with purchase please return item! Ships via media mail.
- Rilegato
- Prima edizione
Da: Bingo Books 2, Vancouver, WA, U.S.A.Bingo Books 2
Contatta il venditoreVenditore con 4 stelleCondizione: Usato - Molto buono
EUR 47,62
EUR 5,43 spedizioneSpedito in U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: Very Good. Condizione sovraccoperta: Very Good. 1st Edition. hardback book and dust jacket in very good-plus condition,from private company library.
