Lingua: Inglese
Editore: Institute of Physics Publishing, 2018
ISBN 10: 0750319445 ISBN 13: 9780750319447
Da: GreatBookPrices, Columbia, MD, U.S.A.
Condizione: As New. Unread book in perfect condition.
Lingua: Inglese
Editore: Institute of Physics Publishing, 2018
ISBN 10: 0750319445 ISBN 13: 9780750319447
Da: GreatBookPrices, Columbia, MD, U.S.A.
Condizione: New.
Da: PBShop.store US, Wood Dale, IL, U.S.A.
PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
Lingua: Inglese
Editore: Institute of Physics Publishing 12/21/2018, 2018
ISBN 10: 0750319445 ISBN 13: 9780750319447
Da: BargainBookStores, Grand Rapids, MI, U.S.A.
Paperback or Softback. Condizione: New. Modern Interferometry for Length Metrology: Exploring limits and novel techniques. Book.
Da: PBShop.store UK, Fairford, GLOS, Regno Unito
EUR 30,78
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Aggiungi al carrelloPAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
Lingua: Inglese
Editore: Institute of Physics Publishing, 2018
ISBN 10: 0750319445 ISBN 13: 9780750319447
Da: GreatBookPricesUK, Woodford Green, Regno Unito
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Aggiungi al carrelloCondizione: New.
Lingua: Inglese
Editore: Institute of Physics Publishing, 2018
ISBN 10: 0750319445 ISBN 13: 9780750319447
Da: Ria Christie Collections, Uxbridge, Regno Unito
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Aggiungi al carrelloCondizione: New. In.
Lingua: Inglese
Editore: Institute of Physics Publishing, 2018
ISBN 10: 0750319445 ISBN 13: 9780750319447
Da: GreatBookPricesUK, Woodford Green, Regno Unito
EUR 33,09
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Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
Lingua: Inglese
Editore: Institute of Physics Publishing, 2018
ISBN 10: 0750319445 ISBN 13: 9780750319447
Da: THE SAINT BOOKSTORE, Southport, Regno Unito
EUR 37,84
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Da: moluna, Greven, Germania
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Aggiungi al carrelloKartoniert / Broschiert. Condizione: New.
Lingua: Inglese
Editore: IOP Publishing Ltd Dez 2018, 2018
ISBN 10: 0750319445 ISBN 13: 9780750319447
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 44,89
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. Neuware - Modern Interferometry for Length Metrology: Exploring limits and novel techniques gives an overview of refined traditional methods and novel techniques in the field of length and distance metrology. The representation of a length according to the definition of the meter in the International System of Units (SI) requires a measurement principle that establishes a relation between the travelling time of light in vacuum and the length to be measured. This comprehensive book covers the basic concepts of length metrology, sophisticated methods to reach smallest measurement uncertainties in length measurements and innovative interferometer concepts. Aimed at students, researchers and practitioners in the field, this book will provide a far-reaching audience with key data, enabling them to better apply and understand interferometry and length metrology.
Lingua: Inglese
Editore: Institute of Physics Publishing, 2018
ISBN 10: 0750319445 ISBN 13: 9780750319447
Da: THE SAINT BOOKSTORE, Southport, Regno Unito
EUR 40,90
Quantità: 2 disponibili
Aggiungi al carrelloPaperback / softback. Condizione: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.