Da: Better World Books, Mishawaka, IN, U.S.A.
Prima edizione
Condizione: Very Good. 1st Edition. Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
Da: Better World Books: West, Reno, NV, U.S.A.
Prima edizione
Condizione: Very Good. 1st Edition. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
Hardcover. Condizione: Very Good. Purple covers and spine with bold clear, lettering. Pages are clean, tight and bright. The prior owner's initials are printed on the top pages' edges.
Lingua: Inglese
Editore: Kluwer Academic Publishers, Norwell, Mass, 2000
ISBN 10: 0792377885 ISBN 13: 9780792377887
Da: BIBLIOPE by Calvello Books, Oakland, CA, U.S.A.
Prima edizione
Hardcover. Condizione: near fine(+). Purple octavo; xvii, 253 p, b&w illus; 24 cm. Contents: Register Transfer Level --; What is It? --; Verifiable RTL --; Applying Design Discipline --; The Verification Process --; Specification Design Decomposition --; High-Level Design Requirements --; Block-Level Specification and Design --; RTL Implementation --; Synthesis and Physical Design --; Functional Test Strategies --; Deterministic or Directed Test --; Random Test --; Transaction Analyzer Verification --; Chip Initialization Verification --; Synthesizable Testbench --; Transformation Test Strategies --; Coverage, Events and Assertions --; Coverage --; Ad-hoc Metrics --; Programming Code Metrics --; State Machine and Arc Coverage Metrics --; User Defined Metrics --; Fault Coverage Metrics --; Regression Analysis and Test Suite Optimization --; Event Monitors and Assertion Checkers --; Events --; Assertions --; Assertion Monitor Library Details --; Event Monitor and Assertion Checker Methodology --; Linting Strategy --; Implementation Considerations --; Event Monitor Database and Analysis --; RTL Methodology Basics --; Simple RTL Verifiable Subset --; Linting --; Linting in a design project --; Lint description --; Project Oriented --; Linting Message Examples --; Object-Based Hardware Design --; OBHD and Simulation --; OBHD and Formal Verification --; OBHD and Physical Design --; OBHD Synthesis --; OBHD Scan Chain Hookup --; A Text Macro Implementation --; RTL Logic Simulation --; Simulation History --; First Steps --; X, Z and Other States --; Function and Timing --; Gate to RTL Migration --; Acceleration and Emulation --; Language Standardization. Integrated circuits -- Very large scale integration -- Computer-aided design. Faint rubbed fold to spine head & foot & folds, barely rubbed corners, else near fine(+). First edition (presumed; no earlier dates stated).
Lingua: Inglese
Editore: Kluwer Academic Publishers Group, 2000
ISBN 10: 0792377885 ISBN 13: 9780792377887
Copia autografata
Hardcover. Condizione: Very Good. Signed by authors Lionel Bening and Harry Foster at the first page. Covers very good with only minor shelf-wear. Spine square. Binding sound. No jacket, as issued. Prior owner's name penned to top of textblock. Pages else clean, interior bright and unmarked. Signed.
Lingua: Inglese
Editore: Kluwer Academic Publishers, 2000
ISBN 10: 0792377885 ISBN 13: 9780792377887
Da: The Book Spot, Sioux Falls, MN, U.S.A.
Hardcover.
Lingua: Inglese
Editore: Kluwer Academic Publishers, 2000
ISBN 10: 0792377885 ISBN 13: 9780792377887
Da: Anybook.com, Lincoln, Regno Unito
EUR 93,69
Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:9780792377887.