ISBN: 9780878910779 - the best test preparation and review course for the fe/eit: fundamentals of engineering : am exam (9 risultati)
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Da: World of Books (was SecondSale), Montgomery, IL, U.S.A.World of Books (was SecondSale)
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Condizione: Fair. The ONLY book with 3 full-length, 4-hour exams, plus 12 comprehensive reviews for the AM portion of the FE(EIT). Step-by-step explanations are presented. Knowledge of the first 90 semester credit hours of a typical engineering program are tested. Thorough reviews are provided for all areas tested on the FE, including the two new sections, Computers and Ethics. For engineering students who are pursuing an 'Engineer-in- Training' certification.…
FE - EIT: AM (Engineer in Training Exam) (Engineering (FE/EiT) Test Preparation)
Ahmed, N. U.; Al-Khafaji, A.; Balachandran, S.; Cimbala, John M.; Friel, L.; Gerez, V.; Huddleston, T.; Ibrahim, R. A.; Kaw, A. K.; Malasri, S.; Muller, M. R.; Ottenstein, Jonathan; Ozokwelu, E.; Purandare, Y. K.; Raus M.S., Randall; Ray, G.; Rikli, N. E.; Samples, J. W.; Simonson, L.
Lingua: Inglese
Editore: Research & Education Association (edition 3rd), 1998
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Da: BooksRun, Philadelphia, PA, U.S.A.BooksRun
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Paperback. Condizione: Fair. 3rd. The item might be beaten up but readable. May contain markings or highlighting, as well as stains, bent corners, or any other major defect, but the text is not obscured in any way.
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Paperback. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.
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Da: World of Books Inc, Montgomery, IL, U.S.A.World of Books Inc
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Condizione: Fair. The ONLY book with 3 full-length, 4-hour exams, plus 12 comprehensive reviews for the AM portion of the FE(EIT). Step-by-step explanations are presented. Knowledge of the first 90 semester credit hours of a typical engineering program are tested. Thorough reviews are provided for all areas tested on the FE, including the two new sections, Computers and Ethics. For engineering students who are pursuing an 'Engineer-in- Training' certification.…
FE - EIT: AM (Engineer in Training Exam) (Engineering (FE/EiT) Test Preparation)
Ahmed, N. U.; Al-Khafaji, A.; Balachandran, S.; Cimbala, John M.; Friel, L.; Gerez, V.; Huddleston, T.; Ibrahim, R. A.; Kaw, A. K.; Malasri, S.; Muller, M. R.; Ottenstein, Jonathan; Ozokwelu, E.; Purandare, Y. K.; Raus M.S., Randall; Ray, G.; Rikli, N. E.; Samples, J. W.; Simonson, L.
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Da: Goodwill Books, Hillsboro, OR, U.S.A.Goodwill Books
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Condizione: acceptable. Fairly worn, but readable and intact. If applicable: Dust jacket, disc or access code may not be included.
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Da: World of Books (was SecondSale), Montgomery, IL, U.S.A.World of Books (was SecondSale)
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Condizione: Good. The ONLY book with 3 full-length, 4-hour exams, plus 12 comprehensive reviews for the AM portion of the FE(EIT). Step-by-step explanations are presented. Knowledge of the first 90 semester credit hours of a typical engineering program are tested. Thorough reviews are provided for all areas tested on the FE, including the two new sections, Computers and Ethics. For engineering students who are pursuing an 'Engineer-in- Training' certification.…
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Da: World of Books Inc, Montgomery, IL, U.S.A.World of Books Inc
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Condizione: Good. The ONLY book with 3 full-length, 4-hour exams, plus 12 comprehensive reviews for the AM portion of the FE(EIT). Step-by-step explanations are presented. Knowledge of the first 90 semester credit hours of a typical engineering program are tested. Thorough reviews are provided for all areas tested on the FE, including the two new sections, Computers and Ethics. For engineering students who are pursuing an 'Engineer-in- Training' certification.…
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Da: GoldBooks, Denver, CO, U.S.A.GoldBooks
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Paperback. Condizione: new. New Copy. Customer Service Guaranteed.
FE - EIT: AM (Engineer in Training Exam) (Engineering (FE/EiT) Test Preparation)
Ahmed, N. U.; Al-Khafaji, A.; Balachandran, S.; Cimbala, John M.; Friel, L.; Gerez, V.; Huddleston, T.; Ibrahim, R. A.; Kaw, A. K.; Malasri, S.; Muller, M. R.; Ottenstein, Jonathan; Ozokwelu, E.; Purandare, Y. K.; Raus M.S., Randall; Ray, G.; Rikli, N. E.; Samples, J. W.; Simonson, L.
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Da: SHIMEDIA, Brooklyn, NY, U.S.A.SHIMEDIA
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