Isbn: 9780878910779 - the best test preparation and review course for the fe/eit: fundamentals of engineering : am exam (9 risultati)

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Da: World of Books (was SecondSale), Montgomery, IL, U.S.A.World of Books (was SecondSale)
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EUR 7,37
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Condizione: Fair. The ONLY book with 3 full-length, 4-hour exams, plus 12 comprehensive reviews for the AM portion of the FE(EIT). Step-by-step explanations are presented. Knowledge of the first 90 semester credit hours of a typical engineering program are tested. Thorough reviews are provided for all areas tested on the FE, including the two new sections, Computers and Ethics. For engineering students who are pursuing an 'Engineer-in- Training' certification.…
Altre immaginiLingua: Inglese
Editore: Research & Education Association, Piscataway, New Jersey, 2004
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Da: Aspen Book Co., Denver, CO, U.S.A.Aspen Book Co.
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Paperback. Condizione: Good. no jacket, paperback. The book is in good condition with a sturdy paperback binding. There are no inscriptions or signatures, and it does not contain any library markings. The cover shows minimal wear, and the pages are clean and free of annotations. The absence of a dust jacket is typical for this paperback edition.…

FE - EIT: AM (Engineer in Training Exam) (Engineering (FE/EiT) Test Preparation)
Ahmed, N. U.; Al-Khafaji, A.; Balachandran, S.; Cimbala, John M.; Friel, L.; Gerez, V.; Huddleston, T.; Ibrahim, R. A.; Kaw, A. K.; Malasri, S.; Muller, M. R.; Ottenstein, Jonathan; Ozokwelu, E.; Purandare, Y. K.; Raus M.S., Randall; Ray, G.; Rikli, N. E.; Samples, J. W.; Simonson, L.
Lingua: Inglese
Editore: Research & Education Association (edition 3rd), 1998
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Da: BooksRun, Philadelphia, PA, U.S.A.BooksRun
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EUR 7,61
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Paperback. Condizione: Fair. 3rd. The item might be beaten up but readable. May contain markings or highlighting, as well as stains, bent corners, or any other major defect, but the text is not obscured in any way.

Fundamentals of Engineering/Engineer-in-Training (FE/EIT)- AM Exam
Ahmed, N. U., Balachandran, S., Cimbala, John M., Friel, L., Al-Khafaji, A.
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Da: Better World Books, Mishawaka, IN, U.S.A.Better World Books
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EUR 7,91
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Condizione: Good. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.

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Da: HPB-Red, Dallas, TX, U.S.A.HPB-Red
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Paperback. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

FE - EIT: AM (Engineer in Training Exam) (Engineering (FE/EiT) Test Preparation)
Ahmed, N. U.; Al-Khafaji, A.; Balachandran, S.; Cimbala, John M.; Friel, L.; Gerez, V.; Huddleston, T.; Ibrahim, R. A.; Kaw, A. K.; Malasri, S.; Muller, M. R.; Ottenstein, Jonathan; Ozokwelu, E.; Purandare, Y. K.; Raus M.S., Randall; Ray, G.; Rikli, N. E.; Samples, J. W.; Simonson, L.
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Da: Goodwill Books, Hillsboro, OR, U.S.A.Goodwill Books
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EUR 4,85
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Condizione: acceptable. Fairly worn, but readable and intact. If applicable: Dust jacket, disc or access code may not be included.

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Da: World of Books Inc, Montgomery, IL, U.S.A.World of Books Inc
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Condizione: Fair. The ONLY book with 3 full-length, 4-hour exams, plus 12 comprehensive reviews for the AM portion of the FE(EIT). Step-by-step explanations are presented. Knowledge of the first 90 semester credit hours of a typical engineering program are tested. Thorough reviews are provided for all areas tested on the FE, including the two new sections, Computers and Ethics. For engineering students who are pursuing an 'Engineer-in- Training' certification.…

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Da: GoldBooks, Denver, CO, U.S.A.GoldBooks
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Paperback. Condizione: new. New Copy. Customer Service Guaranteed.

FE - EIT: AM (Engineer in Training Exam) (Engineering (FE/EiT) Test Preparation)
Ahmed, N. U.; Al-Khafaji, A.; Balachandran, S.; Cimbala, John M.; Friel, L.; Gerez, V.; Huddleston, T.; Ibrahim, R. A.; Kaw, A. K.; Malasri, S.; Muller, M. R.; Ottenstein, Jonathan; Ozokwelu, E.; Purandare, Y. K.; Raus M.S., Randall; Ray, G.; Rikli, N. E.; Samples, J. W.; Simonson, L.
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Da: SHIMEDIA, Brooklyn, NY, U.S.A.SHIMEDIA
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