ISBN: 9780892527656 - automated inspection and measurement (1 risultati)

Automated Inspection and Measurement (Proceedings of Spie)
Chen, Michael J. W. (Editor); Vercruyssen, M.; Luck, Randall L.; Porquet, C.; et.al.
Lingua: Inglese
Editore: SPIE PRESS-The International Society for Optical Engineering; Society of Photo Optical, Bellingham, WA, U.S.A., 1987
- Brossura
- Prima edizione
Da: SUNSET BOOKS 2, Newark, OH, U.S.A.SUNSET BOOKS 2
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Molto buono
EUR 22,03
EUR 6,46 spedizioneSpedito in U.S.A.Quantità: 1 disponibile
Paperback. Condizione: Very Good. No Jacket. 1st. With full markings, labels, pocket and stamps, clean text. Minor wear on edges/corners. Automated Inspection and Measurement - Volume 730, Proceedings of SPIE - The International Society for Optical Engineering, 28-30 October 1986, Cambridge, Massachusetts. Size: 4to. Ex-Library. …