ISBN: 9780913727003 - vlsi: basi mos engineering: 001 (3 risultati)
- Rilegato
Da: HPB-Diamond, Dallas, TX, U.S.A.HPB-Diamond
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Molto buono
EUR 8,83
EUR 3,37 spedizioneSpedito in U.S.A.Quantità: 1 disponibile
hardcover. Condizione: Very Good. Connecting readers with great books since 1972! Used books may not include companion materials, and may have some shelf wear or limited writing. We ship orders daily and Customer Service is our top priority.
Lingua: Inglese
Editore: Pacific Technical Group, Incorporated, Publications Division, 1983
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Da: Better World Books: West, Reno, NV, U.S.A.Better World Books: West
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Buono
EUR 20,91
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibile
Condizione: Good. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
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Da: Kepler-Buchversand Huong Bach, Weil der Stadt, GermaniaKepler-Buchversand Huong Bach
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Molto buono
EUR 17,00
EUR 19,90 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibile
8° , Leinen. Condizione: Gut. XII, 368 S. Gebraucht: Bibliotheksexemplar, ansonsten guter Zustand. Aus dem Inhalt: Introdection to MOS Materials and Processes / Review of Diffusion, Sheet Resistance, and Oxidation / Electrical Characteristics of the P-N Junction / MOS Treshold Voltage from Physics to Engineering / MOS Threshold Voltage Applications / Non-Saturated MOS Operation and Channel Carrier Mobility / Saturated Operation and Device Design / MOS Technologies and Design Rules Additionanl MOS Characteristics and Parsitics / MOS raliability and Process Characterization Sprache: Englisch Gewicht in Gramm: 550.…
