9780931837111 - microscopic identification of electronic defects in semiconductors: symposium held april 15-18, 1985, san francisco, california, u.s.a di johnson, noble m.; bishop, stephen g.; watkins, george d. (1 risultati)
Microscopic Identification of Electronic Defects in Semiconductors (Materials Research Society Symposia Proceedings, Volume 46)
Johnson, Noble M., Stephen G. Bishop, and George D. Watkins, editors
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Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Buono
EUR 29,13
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Hardcover. Condizione: UsedGood. Hardcover; symposium held April 15-18, 1985, in San Francisco; fading and shelf wear to exterior; binding slightly cocked; scrape to side edge of front cover; note written on table of contents page, otherwise text is clean; former owner's stamping inside rear board; contents in good condition.
