Isbn: 9781332281473 - sequential screening in semiconductor manufacturing i: exploiting lot-to-lot variability (classic reprint) (3 risultati)

PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.

PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.

Paperback. Condizione: New. Print on Demand. This book is a rigorous exploration into the practical application of queueing theory to semiconductor manufacturing. It focuses primarily on wafer fabrication, describing the problems faced in the facility and the mathematical tools that can be used to optimize production. The book acknowledges that previous yield models have not accounted for yield variability and spatial dependence, and develops new models to incorporate these factors into screening strategies. The author uses lot and wafer-level data collected from multiple semiconductor fabrication facilities to verify that screening can indeed lead to increased revenue. Operations researchers, industrial engineers, and researchers in the semiconductor manufacturing industry should appreciate the theoretical advancements and practical insights presented here. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item.…