9781402005763 - progress in soi structures and devices operating at extreme conditions (nato science series ii (closed)): 58 (16 risultati)
Lingua: Inglese
Editore: Springer, 2002
Serie: Libro 225 di 241 - NATO Science Series II: Mathematics, Physics and Chemistry
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Lingua: Inglese
Editore: Springer, 2002
Serie: Libro 225 di 241 - NATO Science Series II: Mathematics, Physics and Chemistry
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Lingua: Inglese
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Condizione: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.
Lingua: Inglese
Editore: Springer, 2002
Serie: Libro 225 di 241 - NATO Science Series II: Mathematics, Physics and Chemistry
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Condizione: Used. pp. 368.
Lingua: Inglese
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Serie: Libro 225 di 241 - NATO Science Series II: Mathematics, Physics and Chemistry
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Condizione: Used. pp. 368 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
Lingua: Inglese
Editore: Springer, 2002
Serie: Libro 225 di 241 - NATO Science Series II: Mathematics, Physics and Chemistry
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Condizione: Used. pp. 368.
Lingua: Inglese
Editore: Springer, 2002
Serie: Libro 225 di 241 - NATO Science Series II: Mathematics, Physics and Chemistry
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Lingua: Inglese
Editore: Springer, 2002
Serie: Libro 225 di 241 - NATO Science Series II: Mathematics, Physics and Chemistry
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Lingua: Inglese
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Serie: Libro 225 di 241 - NATO Science Series II: Mathematics, Physics and Chemistry
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Lingua: Inglese
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Serie: Libro 225 di 241 - NATO Science Series II: Mathematics, Physics and Chemistry
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Progress in SOI Structures and Devices Operating at Extreme Conditions
. Ed(s): Balestra, Francis; Nazarov, Alexei N. (National Academy of Science of Ukraine); Lysenko, Vladimir S.
Lingua: Inglese
Editore: Kluwer Academic Publishers, 2002
Serie: Libro 225 di 241 - NATO Science Series II: Mathematics, Physics and Chemistry
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Condizione: New. Proceedings of the NATO Advanced Research Workshop, held in Kyiv, Ukraine, October 15-20, 2000 Editor(s): Balestra, Francis; Nazarov, Alexei N. (National Academy of Science of Ukraine); Lysenko, Vladimir S. Series: NATO Science Series II. Num Pages: 351 pages, biography. BIC Classification: TJFC; TJFD5. Category…: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 240 x 160 x 19. Weight in Grams: 516. . 2002. Softcover reprint of the original 1st ed. 2002. Paperback. . . . .
Lingua: Inglese
Editore: Springer Netherlands, Springer, 2002
Serie: Libro 225 di 241 - NATO Science Series II: Mathematics, Physics and Chemistry
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - A review of the electrical properties, performance and physical mechanisms of the main silicon-on-insulator (SOI) materials and devices. Particular attention is paid to the reliability of SOI structures operating in harsh conditions. The first par…t of the book deals with material technology and describes the SIMOX and ELTRAN technologies, the smart-cut technique, SiCOI structures and MBE growth. The second part covers reliability of devices operating under extreme conditions, with an examination of low and high temperature operation of deep submicron MOSFETs and novel SOI technologies and circuits, SOI in harsh environments and the properties of the buried oxide. The third part deals with the characterization of advanced SOI materials and devices, covering laser-recrystallized SOI layers, ultrashort SOI MOSFETs and nanostructures, gated diodes and SOI devices produced by a variety of techniques. The last part reviews future prospects for SOI structures, analyzing wafer bonding techniques, applications of oxidized porous silicon, semi-insulating silicon materials, self-organization of silicon dots and wires on SOI and some new physical phenomena.
Progress in SOI Structures and Devices Operating at Extreme Conditions
. Ed(s): Balestra, Francis; Nazarov, Alexei N. (National Academy of Science of Ukraine); Lysenko, Vladimir S.
Lingua: Inglese
Editore: Kluwer Academic Publishers, 2002
Serie: Libro 225 di 241 - NATO Science Series II: Mathematics, Physics and Chemistry
- Brossura
Da: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore
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Condizione: New. Proceedings of the NATO Advanced Research Workshop, held in Kyiv, Ukraine, October 15-20, 2000 Editor(s): Balestra, Francis; Nazarov, Alexei N. (National Academy of Science of Ukraine); Lysenko, Vladimir S. Series: NATO Science Series II. Num Pages: 351 pages, biography. BIC Classification: TJFC; TJFD5. Category…: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 240 x 160 x 19. Weight in Grams: 516. . 2002. Softcover reprint of the original 1st ed. 2002. Paperback. . . . . Books ship from the US and Ireland.
Lingua: Inglese
Editore: Springer Netherlands, Springer Netherlands Apr 2002, 2002
Serie: Libro 225 di 241 - NATO Science Series II: Mathematics, Physics and Chemistry
- Brossura
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Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -A review of the electrical properties, performance and physical mechanisms of the main silicon-on-insulator (SOI) materials and devices. Particular attention is paid to the reliability of SOI structures operating in harsh condition…s. The first part of the book deals with material technology and describes the SIMOX and ELTRAN technologies, the smart-cut technique, SiCOI structures and MBE growth. The second part covers reliability of devices operating under extreme conditions, with an examination of low and high temperature operation of deep submicron MOSFETs and novel SOI technologies and circuits, SOI in harsh environments and the properties of the buried oxide. The third part deals with the characterization of advanced SOI materials and devices, covering laser-recrystallized SOI layers, ultrashort SOI MOSFETs and nanostructures, gated diodes and SOI devices produced by a variety of techniques. The last part reviews future prospects for SOI structures, analyzing wafer bonding techniques, applications of oxidized porous silicon, semi-insulating silicon materials, self-organization of silicon dots and wires on SOI and some new physical phenomena. 364 pp. Englisch.
Altre immaginiLingua: Inglese
Editore: Springer, 2002
Serie: Libro 225 di 241 - NATO Science Series II: Mathematics, Physics and Chemistry
- Brossura
- Print on Demand
Da: preigu, Osnabrück, Germaniapreigu
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Taschenbuch. Condizione: Neu. Progress in SOI Structures and Devices Operating at Extreme Conditions | Francis Balestra (u. a.) | Taschenbuch | x | Englisch | 2002 | Springer | EAN 9781402005763 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]co…m | Anbieter: preigu Print on Demand.
Lingua: Inglese
Editore: Springer Netherlands, Springer Apr 2002, 2002
Serie: Libro 225 di 241 - NATO Science Series II: Mathematics, Physics and Chemistry
- Brossura
- Print on Demand
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
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Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -A review of the electrical properties, performance and physical mechanisms of the main silicon-on-insulator (SOI) materials and devices. Particular attention is paid to the reliability of SOI structures operating in harsh conditions. T…he first part of the book deals with material technology and describes the SIMOX and ELTRAN technologies, the smart-cut technique, SiCOI structures and MBE growth. The second part covers reliability of devices operating under extreme conditions, with an examination of low and high temperature operation of deep submicron MOSFETs and novel SOI technologies and circuits, SOI in harsh environments and the properties of the buried oxide. The third part deals with the characterization of advanced SOI materials and devices, covering laser-recrystallized SOI layers, ultrashort SOI MOSFETs and nanostructures, gated diodes and SOI devices produced by a variety of techniques. The last part reviews future prospects for SOI structures, analyzing wafer bonding techniques, applications of oxidized porous silicon, semi-insulating silicon materials, self-organization of silicon dots and wires on SOI and some new physical phenomena.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 364 pp. Englisch.
