Isbn: 9781402072055 - soc system-on-a-chip testing for plug and play test automation: 21 (18 risultati)

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Condizione: Used. pp. 212.

Condizione: New. System-on-a-Chip (SOC) integrated circuits composed of embedded cores are commonplace. Nevertheless, there remain several roadblocks to efficient system integration. This work contains thirteen contributions that address various aspects of SOC testing. It is suitable for researchers and students interested in various aspects of SOC testing. Series: Frontiers in Electronic Testing. Num Pages: 200 pages, biography. BIC Classification: TJFD. Category: (UU) Undergraduate. Dimension: 279 x 210 x 12. Weight in Grams: 588. . 2002. New ed. Hardback. . . . .…

Condizione: Used. pp. 212 Illus.

Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.…

Condizione: Used. pp. 212.

Condizione: New. System-on-a-Chip (SOC) integrated circuits composed of embedded cores are commonplace. Nevertheless, there remain several roadblocks to efficient system integration. This work contains thirteen contributions that address various aspects of SOC testing. It is suitable for researchers and students interested in various aspects of SOC testing. Series: Frontiers in Electronic Testing. Num Pages: 200 pages, biography. BIC Classification: TJFD. Category: (UU) Undergraduate. Dimension: 279 x 210 x 12. Weight in Grams: 588. . 2002. New ed. Hardback. . . . . Books ship from the US and Ireland.…

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Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufactu.…

Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity.SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing.SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing. 212 pp. Englisch.…

Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing. 212 pp. Englisch.…