9781402072932 - Ctl for Test Information of Digital Ics di Kapur, Rohit (16 risultati)

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Condizione: New. From the reviews: "[!] a welcome addition to the literature. [!] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields." Microelectronics Reliability Num Pages: 173 pages, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 12. Weight in Grams: 444. . 2002. Hardback. . . . .

Condizione: As New. Unread book in perfect condition.

Condizione: New. From the reviews: "[!] a welcome addition to the literature. [!] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields." Microelectronics Reliability Num Pages: 173 pages, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 12. Weight in Grams: 444. . 2002. Hardback. . . . . Books ship from the US and Ireland.

Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - CTL is a language that is used to represent test information. It is being developed as a standard within the IEEE framework. The proposed standard IEEE 1450.6 namely the Core Test Language (CTL) has its beginnings in the IEEE 1500 standardization activity as the language to represent test information about a core. The language has been designed to be generally applicable for a number of activities in digital IC testing. This book is focused on describing CTL. CTL for Test Information of Digital ICS is an example-oriented book on CTL that is written with the goal of getting the reader to think like the creators of CTL. Most of the explanations are limited to very simple examples so that the netlist (design) can be drawn out for better visualization of the concepts. There are two types of example CTL syntax in this book. Examples that explain the use of CTL and examples that describe syntax and semantics of the language as it is being introduced. This book should be read by anyone who is interested in testing integrated circuits. The contents of this book are especially relevant to the segment of the industry that is developing cores and/or using cores in system-on-chip methodologies.

Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -From the reviews: '[.] a welcome addition to the literature. [.] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields.' Microelectronics Reliability 188 pp. Englisch.

Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. From the reviews: [.] a welcome addition to the literature. [.] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer.

Buch. Condizione: Neu. CTL for Test Information of Digital ICs | Rohit Kapur | Buch | xi | Englisch | 2002 | Springer US | EAN 9781402072932 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.

Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -CTL is a language that is used to represent test information. It is being developed as a standard within the IEEE framework. The proposed standard IEEE 1450.6 namely the Core Test Language (CTL) has its beginnings in the IEEE 1500 standardization activity as the language to represent test information about a core. The language has been designed to be generally applicable for a number of activities in digital IC testing. This book is focused on describing CTL.CTL for Test Information of Digital ICS is an example-oriented book on CTL that is written with the goal of getting the reader to think like the creators of CTL. Most of the explanations are limited to very simple examples so that the netlist (design) can be drawn out for better visualization of the concepts.There are two types of example CTL syntax in this book. Examples that explain the use of CTL and examples that describe syntax and semantics of the language as it is being introduced.This book should be read by anyone who is interested in testing integrated circuits. The contents of this book are especially relevant to the segment of the industry that is developing cores and/or using cores in system-on-chip methodologies.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 188 pp. Englisch.