Isbn: 9781402080036 - handbook of microscopy for nanotechnology (10 risultati)

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  • Lingua: Inglese

    Editore: Springer, 2005

    1402080034 / 9781402080036

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    Da: Books Puddle, Woodside, NY, U.S.A.Books Puddle

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    EUR 237,94

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    Condizione: New. pp. xx + 742 1st Edition.

  • Lingua: Inglese

    Editore: Springer, 2005

    1402080034 / 9781402080036

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    Da: Majestic Books, Hounslow, Regno UnitoMajestic Books

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    EUR 245,22

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    Condizione: New. pp. xx + 742 Illus.

  • Lingua: Inglese

    Editore: Springer, 2005

    1402080034 / 9781402080036

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    Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections

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    EUR 251,17

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    Condizione: New. In English.

  • Lingua: Inglese

    Editore: Springer, 2005

    1402080034 / 9781402080036

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    Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH

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    EUR 255,00

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    Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.…

  • Lingua: Inglese

    Editore: Kluwer Academic Pub, 2005

    1402080034 / 9781402080036

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    Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books

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    EUR 348,77

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    Quantità: 2 disponibili

    Hardcover. Condizione: Brand New. 1st edition. 731 pages. 9.25x6.25x1.50 inches. In Stock.

  • Lingua: Inglese

    Editore: Springer, 2005

    1402080034 / 9781402080036

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    Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books

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    Condizione: Usato - Come nuovo

    EUR 348,59

    EUR 29,28 spedizione 
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    Quantità: 1 disponibile

    Hardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

  • Lingua: Inglese

    Editore: Springer US, 2005

    1402080034 / 9781402080036

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    Da: moluna, Greven, Germaniamoluna

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    EUR 197,62

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    Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Written by experts in the fieldProvides thorough treatment of the most appropiate microscopy techniques of importance to studying nanostructured materialsNanostructured materials take on an enormously rich variety of properties and prom.…

  • Lingua: Inglese

    Editore: Springer US, Springer US Mär 2005, 2005

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    Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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    EUR 235,39

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    Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy. 768 pp. Englisch.…

  • Lingua: Inglese

    Editore: Springer US, Springer US Mär 2005, 2005

    1402080034 / 9781402080036

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    Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000

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    EUR 235,39

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    Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 768 pp. Englisch.…

  • Lingua: Inglese

    Editore: Springer, 2005

    1402080034 / 9781402080036

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    Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios

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    Condizione: Nuovo

    EUR 340,30

    EUR 9,95 spedizione 
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    Quantità: 4 disponibili

    Condizione: New. PRINT ON DEMAND pp. xx + 742.