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Aggiungi al carrelloHRD. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
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Aggiungi al carrelloHardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Aggiungi al carrelloCondizione: New. Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. SchrimpfUncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that engineers.
Condizione: New. pp. 770.
EUR 280,69
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Aggiungi al carrelloHardcover. Condizione: Brand New. 1st edition. 792 pages. 10.00x7.10x1.50 inches. In Stock.
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Aggiungi al carrelloCondizione: New. pp. 770.
Lingua: Inglese
Editore: Taylor & Francis Inc Nov 2008, 2008
ISBN 10: 1420043765 ISBN 13: 9781420043761
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 290,47
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Aggiungi al carrelloBuch. Condizione: Neu. Neuware - Focusing primarily on silicon-based microelectronics, Defects in Microelectronic Materials and Devices provides a comprehensive overview of recent progress made in understanding the effects of electrically active defects in microelectronic materials. The book places particular emphasis on defects that limit device quality, reliability, manufacturability, and radiation response. Notable theorists and researchers present their perspectives on defects in insulators and in semiconductors as well as hydrogen and defect-related failure mechanisms. The text also discusses compound semiconductor materials for microelectronic applications and examines new information garnered from physics and engineering models.
Da: Majestic Books, Hounslow, Regno Unito
EUR 260,69
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Aggiungi al carrelloCondizione: New. pp. 770 This item is printed on demand.