Isbn: 9781441932990 - beam effects, surface topography, and depth profiling in surface analysis: 5 (11 risultati)

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  • Lingua: Inglese

    Editore: Springer, 2010

    1441932992 / 9781441932990

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    Condizione: New. In English.

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    Lingua: Inglese

    Editore: Humana, 2010

    1441932992 / 9781441932990

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    Taschenbuch. Condizione: Neu. Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis | Alvin W. Czanderna (u. a.) | Taschenbuch | xx | Englisch | 2010 | Humana | EAN 9781441932990 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

  • Lingua: Inglese

    Editore: Springer, 2010

    1441932992 / 9781441932990

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    Condizione: New. pp. 452.

  • Lingua: Inglese

    Editore: Springer US, Humana, 2010

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    Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is thin but it is here that the present volume comfortably sits. Both the newcomer and the more mature scientist will find in these chapters a wealth of detail as well as advice and general guidance of the principal phenomena relevant to the study of real samples. In the analysis of samples, practical analysts have fairly simple models of how everything works. Superimposed on this ideal world is an understanding of how the parameters of the measurement method, the instrumentation, and the char- teristics of the sample distort this ideal world into something less precise, less controlled, and less understood. The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.

  • Lingua: Inglese

    Editore: Springer, 2010

    1441932992 / 9781441932990

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    Paperback. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

  • Lingua: Inglese

    Editore: Springer, 2010

    1441932992 / 9781441932990

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  • Lingua: Inglese

    Editore: Springer US Dez 2010, 2010

    1441932992 / 9781441932990

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    Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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    Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is thin but it is here that the present volume comfortably sits. Both the newcomer and the more mature scientist will find in these chapters a wealth of detail as well as advice and general guidance of the principal phenomena relevant to the study of real samples. In the analysis of samples, practical analysts have fairly simple models of how everything works. Superimposed on this ideal world is an understanding of how the parameters of the measurement method, the instrumentation, and the char- teristics of the sample distort this ideal world into something less precise, less controlled, and less understood. The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior. 456 pp. Englisch.

  • Lingua: Inglese

    Editore: Springer US, 2010

    1441932992 / 9781441932990

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    Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. B.

  • Lingua: Inglese

    Editore: Springer US, Humana Dez 2010, 2010

    1441932992 / 9781441932990

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    Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is thin but it is here that the present volume comfortably sits. Both the newcomer and the more mature scientist will find in these chapters a wealth of detail as well as advice and general guidance of the principal phenomena relevant to the study of real samples. In the analysis of samples, practical analysts have fairly simple models of how everything works. Superimposed on this ideal world is an understanding of how the parameters of the measurement method, the instrumentation, and the char- teristics of the sample distort this ideal world into something less precise, less controlled, and less understood. The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 456 pp. Englisch.

  • Lingua: Inglese

    Editore: Springer, 2010

    1441932992 / 9781441932990

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    Condizione: New. Print on Demand pp. 452 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.

  • Lingua: Inglese

    Editore: Springer, 2010

    1441932992 / 9781441932990

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    Condizione: New. PRINT ON DEMAND pp. 452.