Isbn: 9781441940520 - fault-tolerance techniques for sram-based fpgas: 32 (12 risultati)

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  • Lingua: Inglese

    Editore: Springer, 2010

    1441940529 / 9781441940520

    Serie: Libro 16 di 40 - Frontiers in Electronic Testing

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    Condizione: New. pp. 200.

  • Lingua: Inglese

    Editore: Springer, 2010

    1441940529 / 9781441940520

    Serie: Libro 16 di 40 - Frontiers in Electronic Testing

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    Condizione: New. In English.

  • Lingua: Inglese

    Editore: Springer US, 2006

    1441940529 / 9781441940520

    Serie: Libro 16 di 40 - Frontiers in Electronic Testing

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    Paperback. Condizione: Brand New. 183 pages. 9.00x6.00x0.46 inches. In Stock.

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    Lingua: Inglese

    Editore: Springer, 2010

    1441940529 / 9781441940520

    Serie: Libro 16 di 40 - Frontiers in Electronic Testing

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    Taschenbuch. Condizione: Neu. Fault-Tolerance Techniques for SRAM-Based FPGAs | Fernanda Lima Kastensmidt (u. a.) | Taschenbuch | Frontiers in Electronic Testing | xvi | Englisch | 2010 | Springer | EAN 9781441940520 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

  • Lingua: Inglese

    Editore: Springer, Springer, 2010

    1441940529 / 9781441940520

    Serie: Libro 16 di 40 - Frontiers in Electronic Testing

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    Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH

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    Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Fault-tolerance in integrated circuits is not an exclusive concern regarding space designers or highly-reliable application engineers. Rather, designers of next generation products must cope with reduced margin noises due to technological advances. The continuous evolution of the fabrication technology process of semiconductor components, in terms of transistor geometry shrinking, power supply, speed, and logic density, has significantly reduced the reliability of very deep submicron integrated circuits, in face of the various internal and external sources of noise. The very popular Field Programmable Gate Arrays, customizable by SRAM cells, are a consequence of the integrated circuit evolution with millions of memory cells to implement the logic, embedded memories, routing, and more recently with embedded microprocessors cores. These re-programmable systems-on-chip platforms must be fault-tolerant to cope with present days requirements. This book discusses fault-tolerance techniques for SRAM-based Field Programmable Gate Arrays (FPGAs). It starts by showing the model of the problem and the upset effects in the programmable architecture. In the sequence, it shows the main fault tolerance techniques used nowadays to protect integrated circuits against errors. A large set of methods for designing fault tolerance systems in SRAM-based FPGAs is described. Some presented techniques are based on developing a new fault-tolerant architecture with new robustness FPGA elements. Other techniques are based on protecting the high-level hardware description before the synthesis in the FPGA. The reader has the flexibility of choosing the most suitable fault-tolerance technique for its project and to compare a set of fault tolerant techniques for programmable logic applications.

  • Lingua: Inglese

    Editore: Springer, 2010

    1441940529 / 9781441940520

    Serie: Libro 16 di 40 - Frontiers in Electronic Testing

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    Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books

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    Paperback. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

  • Lingua: Inglese

    Editore: Springer, 2010

    1441940529 / 9781441940520

    Serie: Libro 16 di 40 - Frontiers in Electronic Testing

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    Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand

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  • Lingua: Inglese

    Editore: Springer US Nov 2010, 2010

    1441940529 / 9781441940520

    Serie: Libro 16 di 40 - Frontiers in Electronic Testing

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    Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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    Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book reviews fault-tolerance techniques for SRAM-based Field Programmable Gate Arrays (FPGAs), outlining many methods for designing fault tolerance systems. Some of these are based on new fault-tolerant architecture, and others on protecting the high-level hardware description before synthesis in the FPGA. The text helps the reader choose the best techniques project-by-project, and to compare fault tolerant techniques for programmable logic applications. 200 pp. Englisch.

  • Lingua: Inglese

    Editore: Springer US, 2010

    1441940529 / 9781441940520

    Serie: Libro 16 di 40 - Frontiers in Electronic Testing

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    Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Very few books discuss fault-tolerance techniques for SRAM-based FPGAsShows state-of-the-art fault tolerance solutions for FPGAsShows fault-tolerance techniques that can be applied in different design phasesDiscusses the main differe.

  • Lingua: Inglese

    Editore: Springer, 2010

    1441940529 / 9781441940520

    Serie: Libro 16 di 40 - Frontiers in Electronic Testing

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    Da: Majestic Books, Hounslow, Regno UnitoMajestic Books

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    EUR 148,61

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    Condizione: New. Print on Demand pp. 200 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.

  • Lingua: Inglese

    Editore: Springer, 2010

    1441940529 / 9781441940520

    Serie: Libro 16 di 40 - Frontiers in Electronic Testing

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    Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios

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    Condizione: New. PRINT ON DEMAND pp. 200.

  • Lingua: Inglese

    Editore: Springer, Springer Nov 2010, 2010

    1441940529 / 9781441940520

    Serie: Libro 16 di 40 - Frontiers in Electronic Testing

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    Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000

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    EUR 106,99

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    Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Fault-tolerance in integrated circuits is not an exclusive concern regarding space designers or highly-reliable application engineers. Rather, designers of next generation products must cope with reduced margin noises due to technological advances. The continuous evolution of the fabrication technology process of semiconductor components, in terms of transistor geometry shrinking, power supply, speed, and logic density, has significantly reduced the reliability of very deep submicron integrated circuits, in face of the various internal and external sources of noise. The very popular Field Programmable Gate Arrays, customizable by SRAM cells, are a consequence of the integrated circuit evolution with millions of memory cells to implement the logic, embedded memories, routing, and more recently with embedded microprocessors cores. These re-programmable systems-on-chip platforms must be fault-tolerant to cope with present days requirements. This book discusses fault-tolerance techniques for SRAM-based Field Programmable Gate Arrays (FPGAs). It starts by showing the model of the problem and the upset effects in the programmable architecture. In the sequence, it shows the main fault tolerance techniques used nowadays to protect integrated circuits against errors. A large set of methods for designing fault tolerance systems in SRAM-based FPGAs is described. Some presented techniques are based on developing a new fault-tolerant architecture with new robustness FPGA elements. Other techniques are based on protecting the high-level hardware description before the synthesis in the FPGA. The reader has the flexibility of choosing the most suitable fault-tolerance technique for its project and to compare a set of fault tolerant techniques for programmable logic applications.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 200 pp. Englisch.