Isbn: 9781441945136 - emerging nanotechnologies: test, defect tolerance, and reliability: 37 (8 risultati)

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  • Lingua: Inglese

    Editore: Springer, 2010

    144194513X / 9781441945136

    Serie: Libro 19 di 40 - Frontiers in Electronic Testing

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    Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH

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    EUR 174,36

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    Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.…

  • Lingua: Inglese

    Editore: Springer, 2007

    144194513X / 9781441945136

    Serie: Libro 19 di 40 - Frontiers in Electronic Testing

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    Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books

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    EUR 239,98

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    Quantità: 2 disponibili

    Paperback. Condizione: Brand New. 420 pages. 9.09x6.10x0.98 inches. In Stock.

  • Lingua: Inglese

    Editore: Springer, 2010

    144194513X / 9781441945136

    Serie: Libro 19 di 40 - Frontiers in Electronic Testing

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    Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections

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    EUR 250,00

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    Condizione: New. In English.

  • Lingua: Inglese

    Editore: Springer, 2010

    144194513X / 9781441945136

    Serie: Libro 19 di 40 - Frontiers in Electronic Testing

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    Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books

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    Condizione: Usato - Come nuovo

    EUR 258,13

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    Paperback. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

  • Lingua: Inglese

    Editore: Springer, 2010

    144194513X / 9781441945136

    Serie: Libro 19 di 40 - Frontiers in Electronic Testing

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    Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand

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    EUR 126,26

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    Condizione: new. Questo è un articolo print on demand.

  • Lingua: Inglese

    Editore: Springer US, Springer US Nov 2010, 2010

    144194513X / 9781441945136

    Serie: Libro 19 di 40 - Frontiers in Electronic Testing

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    Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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    EUR 160,49

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    Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field. 420 pp. Englisch. …

  • Lingua: Inglese

    Editore: Springer US, 2010

    144194513X / 9781441945136

    Serie: Libro 19 di 40 - Frontiers in Electronic Testing

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    Da: moluna, Greven, Germaniamoluna

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    EUR 136,16

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    Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Covers various technologies that have been suggested by researchers over the last decadesIncludes technologies such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), nanowires and carbon nanotubesDiscus.…

  • Lingua: Inglese

    Editore: Springer US, Springer US Nov 2010, 2010

    144194513X / 9781441945136

    Serie: Libro 19 di 40 - Frontiers in Electronic Testing

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    Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000

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    Condizione: Nuovo

    EUR 160,49

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    Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality. Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 420 pp. Englisch. …