9781461337294 - advances in x-ray analysis: volume 26 di hubbard, camden r. r. (13 risultati)
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Paperback. Condizione: new. Paperback. At the Denver X-Ray Conference, the topic for the plenary lectures alternates annually between x-ray diffraction and x-ray fluorescence. This year is a "diffraction" year, and the theme is accuracy in powder diffraction. Instead of comprehensive cover age, such as was attempted at the Accur…acy in Powder Diffraction Meeting held at the National Bureau of Standards in 1978, this meeting focuses on recent developments in measurement accuracy of two-theta and intensity. The focus on accuracy, from the practical point of view, is important in a wide range of x-ray diffraction measurements. Accu rate data improve our ability to identify phases in a mixture using the Powder Diffraction File. Improved accuracy is essential for better characterization of the lattice, crystallite size, strain and structure. Finally, the accuracy of quantitative analysis is of great concern in many laboratories. The five invited papers of the plenary session give a broad perspective of recent activity throughout the world on uses of more accurate data, on methods to achieve greater accuracy, and on fundamental factors affecting the accuracy. The scope of the conference, however, is much broader than that of the plenary session. The workshops lead off with many practical aspects of x-ray analysis. Many of the contributed papers expand on the theme of accuracy in x-ray powder diffraction. In particular, the s.ession on XRD quantitative phase analysis provides an exception al coverage of the limitations in quantitative analysis and of the techniques being employed to improve the results. At the Denver X-Ray Conference, the topic for the plenary lectures alternates annually between x-ray diffraction and x-ray fluorescence. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Condizione: New. pp. 496 Index.
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Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - At the Denver X-Ray Conference, the topic for the plenary lectures alternates annually between x-ray diffraction and x-ray fluorescence. This year is a 'diffraction' year, and the theme is accuracy in powder diffraction. Instead of comprehensive c…over age, such as was attempted at the Accuracy in Powder Diffraction Meeting held at the National Bureau of Standards in 1978, this meeting focuses on recent developments in measurement accuracy of two-theta and intensity. The focus on accuracy, from the practical point of view, is important in a wide range of x-ray diffraction measurements. Accu rate data improve our ability to identify phases in a mixture using the Powder Diffraction File. Improved accuracy is essential for better characterization of the lattice, crystallite size, strain and structure. Finally, the accuracy of quantitative analysis is of great concern in many laboratories. The five invited papers of the plenary session give a broad perspective of recent activity throughout the world on uses of more accurate data, on methods to achieve greater accuracy, and on fundamental factors affecting the accuracy. The scope of the conference, however, is much broader than that of the plenary session. The workshops lead off with many practical aspects of x-ray analysis. Many of the contributed papers expand on the theme of accuracy in x-ray powder diffraction. In particular, the s.ession on XRD quantitative phase analysis provides an exception al coverage of the limitations in quantitative analysis and of the techniques being employed to improve the results.
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Paperback. Condizione: new. Paperback. At the Denver X-Ray Conference, the topic for the plenary lectures alternates annually between x-ray diffraction and x-ray fluorescence. This year is a "diffraction" year, and the theme is accuracy in powder diffraction. Instead of comprehensive cover age, such as was attempted at the Accur…acy in Powder Diffraction Meeting held at the National Bureau of Standards in 1978, this meeting focuses on recent developments in measurement accuracy of two-theta and intensity. The focus on accuracy, from the practical point of view, is important in a wide range of x-ray diffraction measurements. Accu rate data improve our ability to identify phases in a mixture using the Powder Diffraction File. Improved accuracy is essential for better characterization of the lattice, crystallite size, strain and structure. Finally, the accuracy of quantitative analysis is of great concern in many laboratories. The five invited papers of the plenary session give a broad perspective of recent activity throughout the world on uses of more accurate data, on methods to achieve greater accuracy, and on fundamental factors affecting the accuracy. The scope of the conference, however, is much broader than that of the plenary session. The workshops lead off with many practical aspects of x-ray analysis. Many of the contributed papers expand on the theme of accuracy in x-ray powder diffraction. In particular, the s.ession on XRD quantitative phase analysis provides an exception al coverage of the limitations in quantitative analysis and of the techniques being employed to improve the results. At the Denver X-Ray Conference, the topic for the plenary lectures alternates annually between x-ray diffraction and x-ray fluorescence. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -At the Denver X-Ray Conference, the topic for the plenary lectures alternates annually between x-ray diffraction and x-ray fluorescence. This year is a 'diffraction' year, and the theme is accuracy in powder diffraction. Instead of… comprehensive cover age, such as was attempted at the Accuracy in Powder Diffraction Meeting held at the National Bureau of Standards in 1978, this meeting focuses on recent developments in measurement accuracy of two-theta and intensity. The focus on accuracy, from the practical point of view, is important in a wide range of x-ray diffraction measurements. Accu rate data improve our ability to identify phases in a mixture using the Powder Diffraction File. Improved accuracy is essential for better characterization of the lattice, crystallite size, strain and structure. Finally, the accuracy of quantitative analysis is of great concern in many laboratories. The five invited papers of the plenary session give a broad perspective of recent activity throughout the world on uses of more accurate data, on methods to achieve greater accuracy, and on fundamental factors affecting the accuracy. The scope of the conference, however, is much broader than that of the plenary session. The workshops lead off with many practical aspects of x-ray analysis. Many of the contributed papers expand on the theme of accuracy in x-ray powder diffraction. In particular, the s.ession on XRD quantitative phase analysis provides an exception al coverage of the limitations in quantitative analysis and of the techniques being employed to improve the results. 496 pp. Englisch.
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Condizione: New. Print on Demand pp. 496 67:B&W 6.69 x 9.61 in or 244 x 170 mm (Pinched Crown) Perfect Bound on White w/Gloss Lam.
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Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -At the Denver X-Ray Conference, the topic for the plenary lectures alternates annually between x-ray diffraction and x-ray fluorescence. This year is a 'diffraction' year, and the theme is accuracy in powder diffraction. Instead of com…prehensive cover age, such as was attempted at the Accuracy in Powder Diffraction Meeting held at the National Bureau of Standards in 1978, this meeting focuses on recent developments in measurement accuracy of two-theta and intensity. The focus on accuracy, from the practical point of view, is important in a wide range of x-ray diffraction measurements. Accu rate data improve our ability to identify phases in a mixture using the Powder Diffraction File. Improved accuracy is essential for better characterization of the lattice, crystallite size, strain and structure. Finally, the accuracy of quantitative analysis is of great concern in many laboratories. The five invited papers of the plenary session give a broad perspective of recent activity throughout the world on uses of more accurate data, on methods to achieve greater accuracy, and on fundamental factors affecting the accuracy. The scope of the conference, however, is much broader than that of the plenary session. The workshops lead off with many practical aspects of x-ray analysis. Many of the contributed papers expand on the theme of accuracy in x-ray powder diffraction. In particular, the s.ession on XRD quantitative phase analysis provides an exception al coverage of the limitations in quantitative analysis and of the techniques being employed to improve the results.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 496 pp. Englisch.
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Taschenbuch. Condizione: Neu. Advances in X-Ray Analysis | Volume 26 | Camden R. Hubbard | Taschenbuch | 492 S. | Englisch | 2011 | Springer | EAN 9781461337294 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Dema…nd.
