9781461354147 - Design of High-Performance CMOS Voltage-Controlled Oscillators: 708 di Dai, Liang (11 risultati)

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Taschenbuch. Condizione: Neu. Design of High-Performance CMOS Voltage-Controlled Oscillators | Liang Dai (u. a.) | Taschenbuch | xix | Englisch | 2012 | Springer | EAN 9781461354147 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Condizione: New. pp. 184.

Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Design of High-Performance CMOS Voltage-Controlled Oscillators presents a phase noise modeling framework for CMOS ring oscillators. The analysis considers both linear and nonlinear operation. It indicates that fast rail-to-rail switching has to be achieved to minimize phase noise. Additionally, in conventional design the flicker noise in the bias circuit can potentially dominate the phase noise at low offset frequencies. Therefore, for narrow bandwidth PLLs, noise up conversion for the bias circuits should be minimized. We define the effective Q factor (Qeff) for ring oscillators and predict its increase for CMOS processes with smaller feature sizes. Our phase noise analysis is validated via simulation and measurement results.The digital switching noise coupled through the power supply and substrate is usually the dominant source of clock jitter. Improving the supply and substrate noise immunity of a PLL is a challenging job in hostile environments such as a microprocessor chip where millions of digital gates are present.

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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Design of High-Performance CMOS Voltage-Controlled Oscillators presents a phase noise modeling framework for CMOS ring oscillators. The analysis considers both linear and nonlinear operation. It indicates that fast rail-to-rail switching has to be achieved to minimize phase noise. Additionally, in conventional design the flicker noise in the bias circuit can potentially dominate the phase noise at low offset frequencies. Therefore, for narrow bandwidth PLLs, noise up conversion for the bias circuits should be minimized. We define the effective Q factor (Qeff) for ring oscillators and predict its increase for CMOS processes with smaller feature sizes. Our phase noise analysis is validated via simulation and measurement results.The digital switching noise coupled through the power supply and substrate is usually the dominant source of clock jitter. Improving the supply and substrate noise immunity of a PLL is a challenging job in hostile environments such as a microprocessor chip where millions of digital gates are present. 184 pp. Englisch.

Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Design of High-Performance CMOS Voltage-Controlled Oscillators presents a phase noise modeling framework for CMOS ring oscillators. The analysis considers both linear and nonlinear operation. It indicates that fast rail-to-rail switching ha.

Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Design of High-Performance CMOS Voltage-Controlled Oscillators presents a phase noise modeling framework for CMOS ring oscillators. The analysis considers both linear and nonlinear operation. It indicates that fast rail-to-rail switching has to be achieved to minimize phase noise. Additionally, in conventional design the flicker noise in the bias circuit can potentially dominate the phase noise at low offset frequencies. Therefore, for narrow bandwidth PLLs, noise up conversion for the bias circuits should be minimized. We define the effective Q factor (Qeff) for ring oscillators and predict its increase for CMOS processes with smaller feature sizes. Our phase noise analysis is validated via simulation and measurement results.The digital switching noise coupled through the power supply and substrate is usually the dominant source of clock jitter. Improving the supply and substrate noise immunity of a PLL is a challenging job in hostile environments such as a microprocessor chip where millions of digital gates are present.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 184 pp. Englisch.

Condizione: New. Print on Demand pp. 184 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.

Condizione: New. PRINT ON DEMAND pp. 184.