9781461359920 - analog signal generation for built-in-self-test of mixed-signal integrated circuits: 312 di roberts, gordon w. (11 risultati)

Lingua: Inglese
Editore: Springer, 2012
Serie: Libro 88 di 260 - The Springer International Series in Engineering and Computer Science
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Lingua: Inglese
Editore: Springer, 2012
Serie: Libro 88 di 260 - The Springer International Series in Engineering and Computer Science
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Lingua: Inglese
Editore: Springer, 2012
Serie: Libro 88 di 260 - The Springer International Series in Engineering and Computer Science
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Condizione: New. pp. 136 Index.

Lingua: Inglese
Editore: Springer, 2012
Serie: Libro 88 di 260 - The Springer International Series in Engineering and Computer Science
- Brossura
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Paperback. Condizione: Brand New. 131 pages. 9.01x5.98x0.31 inches. In Stock.

Lingua: Inglese
Editore: Springer US, 2012
Serie: Libro 88 di 260 - The Springer International Series in Engineering and Computer Science
- Brossura
Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique. The book begins with a brief introduction to the testing problem and a review of co…nventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix. The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.

Lingua: Inglese
Editore: Springer, 2012
Serie: Libro 88 di 260 - The Springer International Series in Engineering and Computer Science
- Brossura
- Print on Demand
Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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Lingua: Inglese
Editore: Springer US, Springer New York Sep 2012, 2012
Serie: Libro 88 di 260 - The Springer International Series in Engineering and Computer Science
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Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique. The book begins with a brief introduction to the testing problem an…d a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix. The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods. 136 pp. Englisch.

Lingua: Inglese
Editore: Springer US, 2012
Serie: Libro 88 di 260 - The Springer International Series in Engineering and Computer Science
- Brossura
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Da: moluna, Greven, Germaniamoluna
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Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique. The book begins with a brief introduction to the tes…ting problem a.

Lingua: Inglese
Editore: Springer, 2012
Serie: Libro 88 di 260 - The Springer International Series in Engineering and Computer Science
- Brossura
- Print on Demand
Da: Majestic Books, Hounslow, Regno UnitoMajestic Books
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Condizione: New. Print on Demand pp. 136 23:B&W 6 x 9 in or 229 x 152 mm Perfect Bound on White w/Gloss Lam.

Lingua: Inglese
Editore: Springer, 2012
Serie: Libro 88 di 260 - The Springer International Series in Engineering and Computer Science
- Brossura
- Print on Demand
Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios
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Condizione: New. PRINT ON DEMAND pp. 136.

Lingua: Inglese
Editore: Springer, Springer Sep 2012, 2012
Serie: Libro 88 di 260 - The Springer International Series in Engineering and Computer Science
- Brossura
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Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
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Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique.The book begins with a brief introduction to the testing problem and a r…eview of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix.The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 136 pp. Englisch.