ISBN: 9781528508865 - transmission/reflection and short-circuit line permittivity measurements (classic reprint) (3 risultati)

PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.

PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.

Paperback. Condizione: New. Print on Demand. This book explores the methods for measuring complex dielectric constants, focusing on two techniques: transmission/reflection and short-circuit line. The author presents new equations for determining complex permittivity, derivations for scattering parameters, and uncertainty analysis. The text examines the stability of solutions and presents a robust algorithm to eliminate ill-behaved nature at specific frequencies. It also provides new equations for determining complex permittivity independent of reference plane position and sample length, along with corrections for gaps between samples and sample holders. The author's detailed analysis elucidates the strengths and weaknesses of each method, enabling readers to make informed choices based on their specific needs and providing a valuable resource for researchers and practitioners in the field of dielectric measurements. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item.…