9781839682292 - recent developments in atomic force microscopy and raman spectroscopy for materials characterization di chandra shakher pathak (editor) & samir kumar (editor) (9 risultati)
Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
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Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
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Da: PBShop.store UK, Fairford, GLOS, Regno UnitoPBShop.store UK
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HRD. Condizione: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
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Da: PBShop.store US, Wood Dale, IL, U.S.A.PBShop.store US
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Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
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Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
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Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. T…his volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy. 274 pp. Englisch.
Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
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Da: THE SAINT BOOKSTORE, Southport, Regno UnitoTHE SAINT BOOKSTORE
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Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
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Da: moluna, Greven, Germaniamoluna
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Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. KlappentextrnrnThis book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spect…roscopy for characterizing various mate.
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Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
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Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
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EUR 129,00
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Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This…volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.Books on Demand GmbH, Überseering 33, 22297 Hamburg 274 pp. Englisch.
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Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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EUR 129,00
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Buch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This v…olume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.
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Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
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Da: preigu, Osnabrück, Germaniapreigu
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EUR 129,00
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Buch. Condizione: Neu. Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization | Chandra Shakher Pathak (u. a.) | Buch | Gebunden | Englisch | 2022 | IntechOpen | EAN 9781839682292 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mai…l[at]preigu[dot]de | Anbieter: preigu Print on Demand.
