9783030307288 - nanoelectronic coupled problems solutions: 29 (10 risultati)
Lingua: Inglese
Editore: Springer 2020
Serie: Mathematics in Industry, Libro 27 di 32. Libro 27 di 32 - Mathematics in Industry
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Condizione: New. 1st ed. 2019 edition NO-PA16APR2015-KAP.
Lingua: Inglese
Editore: Springer International Publishing 2020
Serie: Mathematics in Industry, Libro 27 di 32. Libro 27 di 32 - Mathematics in Industry
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Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Designs in nanoelectronics often lead to challenging simulation problems and include strong feedback couplings. Industry demands provisions for variability in order to guarantee quality and yield. It also requires the incorporation of higher abstr…action levels to allow for system simulation in order to shorten the design cycles, while at the same time preserving accuracy. The methods developed here promote a methodology for circuit-and-system-level modelling and simulation based on best practice rules, which are used to deal with coupled electromagnetic field-circuit-heat problems, as well as coupled electro-thermal-stress problems that emerge in nanoelectronic designs. This book covers:(1) advanced monolithic/multirate/co-simulation techniques, which are combined with envelope/wavelet approaches to create efficient and robust simulation techniques for strongly coupled systems that exploit the different dynamics of sub-systems within multiphysics problems, and which allow designers to predict reliability and ageing; (2) new generalized techniques in Uncertainty Quantification (UQ) for coupled problems to include a variability capability such that robust design and optimization, worst case analysis, and yield estimation with tiny failure probabilities are possible (including large deviations like 6-sigma); (3) enhanced sparse, parametric Model Order Reduction techniques with a posteriori error estimation for coupled problems and for UQ to reduce the complexity of the sub-systems while ensuring that the operational and coupling parameters can still be varied and that the reduced models offer higher abstraction levels that can be efficiently simulated. All the new algorithms produced were implemented, transferred and tested by the EDA vendor MAGWEL. Validation was conducted on industrial designs provided by end-users from the semiconductor industry, who shared their feedback, contributed to the measurements, and supplied both material data and process data. In closing, a thorough comparison to measurements on real devices was made in order to demonstrate the algorithms' industrial applicability.
Lingua: Inglese
Editore: Springer 2020
Serie: Mathematics in Industry, Libro 27 di 32. Libro 27 di 32 - Mathematics in Industry
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Taschenbuch. Condizione: Neu. Nanoelectronic Coupled Problems Solutions | E. Jan W. Ter Maten (u. a.) | Taschenbuch | Mathematics in Industry | xxx | Englisch | 2020 | Springer | EAN 9783030307288 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]…com | Anbieter: preigu.
Lingua: Inglese
Editore: Springer 2020
Serie: Mathematics in Industry, Libro 27 di 32. Libro 27 di 32 - Mathematics in Industry
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Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books
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Paperback. Condizione: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Lingua: Inglese
Editore: Springer 2020
Serie: Mathematics in Industry, Libro 27 di 32. Libro 27 di 32 - Mathematics in Industry
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Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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Condizione: new. Questo è un articolo print on demand.
Lingua: Inglese
Editore: Springer International Publishing Nov 2020 2020
Serie: Mathematics in Industry, Libro 27 di 32. Libro 27 di 32 - Mathematics in Industry
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Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, , GermaniaBuchWeltWeit Ludwig Meier e.K.
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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Designs in nanoelectronics often lead to challenging simulation problems and include strong feedback couplings. Industry demands provisions for variability in order to guarantee quality and yield. It also requires the incorporation… of higher abstraction levels to allow for system simulation in order to shorten the design cycles, while at the same time preserving accuracy. The methods developed here promote a methodology for circuit-and-system-level modelling and simulation based on best practice rules, which are used to deal with coupled electromagnetic field-circuit-heat problems, as well as coupled electro-thermal-stress problems that emerge in nanoelectronic designs. This book covers:(1) advanced monolithic/multirate/co-simulation techniques, which are combined with envelope/wavelet approaches to create efficient and robust simulation techniques for strongly coupled systems that exploit the different dynamics of sub-systems within multiphysics problems, and which allow designers to predict reliability and ageing; (2) new generalized techniques in Uncertainty Quantification (UQ) for coupled problems to include a variability capability such that robust design and optimization, worst case analysis, and yield estimation with tiny failure probabilities are possible (including large deviations like 6-sigma); (3) enhanced sparse, parametric Model Order Reduction techniques with a posteriori error estimation for coupled problems and for UQ to reduce the complexity of the sub-systems while ensuring that the operational and coupling parameters can still be varied and that the reduced models offer higher abstraction levels that can be efficiently simulated. All the new algorithms produced were implemented, transferred and tested by the EDA vendor MAGWEL. Validation was conducted on industrial designs provided by end-users from the semiconductor industry, who shared their feedback, contributed to the measurements, and supplied both material data and process data. In closing, a thorough comparison to measurements on real devices was made in order to demonstrate the algorithms' industrial applicability. 620 pp. Englisch.
Lingua: Inglese
Editore: Springer 2020
Serie: Mathematics in Industry, Libro 27 di 32. Libro 27 di 32 - Mathematics in Industry
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Da: Majestic Books, Hounslow, , Regno UnitoMajestic Books
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Condizione: New. Print on Demand.
Lingua: Inglese
Editore: Springer 2020
Serie: Mathematics in Industry, Libro 27 di 32. Libro 27 di 32 - Mathematics in Industry
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Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios
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Condizione: New. PRINT ON DEMAND.
Nanoelectronic Coupled Problems Solutions
ter Maten, E. Jan W.|Brachtendorf, Hans-Georg|Pulch, Roland|Schoenmaker, Wim|De Gersem, Herbert
Lingua: Inglese
Editore: Springer International Publishing 2020
Serie: Mathematics in Industry, Libro 27 di 32. Libro 27 di 32 - Mathematics in Industry
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Da: moluna, Greven, , Germaniamoluna
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Kartoniert / Broschiert. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Combines advanced methods for solving strongly coupled problems involving multirate dynamics in time and frequency domain with applications to Uncertainty Quantification and Fast Fault Simula…tionUnique ingredient is provided by parametri.
Lingua: Inglese
Editore: Springer, Palgrave Macmillan Nov 2020 2020
Serie: Mathematics in Industry, Libro 27 di 32. Libro 27 di 32 - Mathematics in Industry
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Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
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Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Designs in nanoelectronics often lead to challenging simulation problems and include strong feedback couplings. Industry demands provisions for variability in order to guarantee quality and yield. It also requires the incorporation of…higher abstraction levels to allow for system simulation in order to shorten the design cycles, while at the same time preserving accuracy. The methods developed here promote a methodology for circuit-and-system-level modelling and simulation based on best practice rules, which are used to deal with coupled electromagnetic field-circuit-heat problems, as well as coupled electro-thermal-stress problems that emerge in nanoelectronic designs. This book covers:(1) advanced monolithic/multirate/co-simulation techniques, which are combined with envelope/wavelet approaches to create efficient and robust simulation techniques for strongly coupled systems that exploit the different dynamics of sub-systems within multiphysics problems, and which allow designers to predict reliability and ageing;(2) new generalized techniques in Uncertainty Quantification (UQ) for coupled problems to include a variability capability such that robust design and optimization, worst case analysis, and yield estimation with tiny failure probabilities are possible (including large deviations like 6-sigma);(3) enhanced sparse, parametric Model Order Reduction techniques with a posteriori error estimation for coupled problems and for UQ to reduce the complexity of the sub-systems while ensuring that the operational and coupling parameters can still be varied and that the reduced models offer higher abstraction levels that can be efficiently simulated.All the new algorithms produced were implemented, transferred and tested by the EDA vendor MAGWEL. Validation was conducted on industrial designs provided by end-users from the semiconductor industry, who shared their feedback, contributed to the measurements, and supplied both material data and process data. In closing, a thorough comparison to measurements on real devices was made in order to demonstrate the algorithms' industrial applicability.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 620 pp. Englisch.
