9783030520168 - dependable embedded systems (17 risultati)
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Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
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Da: Books Puddle, New York, NY, U.S.A.Books Puddle
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Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
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Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
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Hardcover. Condizione: Brand New. 621 pages. 9.25x6.10x1.61 inches. In Stock.
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from to…day's points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc.Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems;Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers;Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.
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Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books
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Hardcover. Condizione: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Da: Buchpark, Trebbin, GermaniaBuchpark
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Condizione: Hervorragend. Zustand: Hervorragend | Seiten: 624 | Sprache: Englisch | Produktart: Bücher | This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent… reliability concerns from today¿s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc.Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems;Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers;Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.
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- Print on Demand
Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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Condizione: new. Questo è un articolo print on demand.
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Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
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Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability…concerns from today's points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc.Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems;Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers;Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems. 624 pp. Englisch.
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Da: Majestic Books, Hounslow, Regno UnitoMajestic Books
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Condizione: New. Print on Demand.
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Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios
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EUR 75,81
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Condizione: New. PRINT ON DEMAND.
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Da: moluna, Greven, Germaniamoluna
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EUR 48,37
EUR 48,99 spedizioneSpedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systemsDescribes cross-layer approaches that can leverage reliability through techn…iques that are pro-actively designed with.
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Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
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Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability conc…erns from today¿s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc.Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems;Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers;Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 624 pp. Englisch.
