9783032194084 - analog integrated circuit design under pvt conditions: efficient reinforcement and transfer learning techniques di oliveira paiva, pedro alberto; mota da costa, josé pedro ponte; de azevedo, filipe parrado; ferreira martins, ricardo miguel (9 risultati)
Lingua: Inglese
Editore: Springer Nature Switzerland AG, Cham 2026
Serie: SpringerBriefs in Applied Sciences and Technology, Libro 453 di 472. Libro 453 di 472 - SpringerBriefs in Applied Sciences and Technology
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Da: Grand Eagle Retail, Bensenville, IL, U.S.A.Grand Eagle Retail
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Paperback. Condizione: new. Paperback. This book delivers a focused, technical exploration of automated analog and RF integrated circuit sizing under process, voltage, and temperature variations, guiding readers through foundational concepts, current methodologies, and advanced machinelearningdriven approaches. It first examines… multiple reinforcementlearningbased strategies for embedding PVT conditions directly into modern sizing flows, clarifying their conceptual differences and practical implications. It then explores a complementary deeplearningassisted approach that leverages ANNbased performance regressors, transfer learning, and adaptive refinement to accelerate simulationdriven optimization without requiring extensive cornerspecific datasets. Together, these chapters provide a grounded overview of current techniques and ongoing developments in automated analog IC design. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
Lingua: Inglese
Editore: Springer 2026
Serie: SpringerBriefs in Applied Sciences and Technology, Libro 453 di 472. Libro 453 di 472 - SpringerBriefs in Applied Sciences and Technology
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Da: Revaluation Books, Exeter, , Regno UnitoRevaluation Books
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Paperback. Condizione: Brand New. 103 pages. 6.10x0.24x9.25 inches. In Stock.
Lingua: Inglese
Editore: Springer 2026
Serie: SpringerBriefs in Applied Sciences and Technology, Libro 453 di 472. Libro 453 di 472 - SpringerBriefs in Applied Sciences and Technology
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Da: Books Puddle, New York, NY, U.S.A.Books Puddle
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Condizione: New.
Lingua: Inglese
Editore: Springer, Springer 2026
Serie: SpringerBriefs in Applied Sciences and Technology, Libro 453 di 472. Libro 453 di 472 - SpringerBriefs in Applied Sciences and Technology
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book delivers a focused, technical exploration of automated analog and RF integrated circuit sizing under process, voltage, and temperature variations, guiding readers through foundational concepts, current methodologies, and advanced machine… learning driven approaches. It first examines multiple reinforcement learning based strategies for embedding PVT conditions directly into modern sizing flows, clarifying their conceptual differences and practical implications. It then explores a complementary deep learning assisted approach that leverages ANN based performance regressors, transfer learning, and adaptive refinement to accelerate simulation driven optimization without requiring extensive corner specific datasets. Together, these chapters provide a grounded overview of current techniques and ongoing developments in automated analog IC design.
Lingua: Inglese
Editore: Springer, Berlin, Springer Jul 2026 2026
Serie: SpringerBriefs in Applied Sciences and Technology, Libro 453 di 472. Libro 453 di 472 - SpringerBriefs in Applied Sciences and Technology
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Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, , GermaniaBuchWeltWeit Ludwig Meier e.K.
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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book delivers a focused, technical exploration of automated analog and RF integrated circuit sizing under process, voltage, and temperature variations, guiding readers through foundational concepts, current methodologies, and…advanced machine learning driven approaches. It first examines multiple reinforcement learning based strategies for embedding PVT conditions directly into modern sizing flows, clarifying their conceptual differences and practical implications. It then explores a complementary deep learning assisted approach that leverages ANN based performance regressors, transfer learning, and adaptive refinement to accelerate simulation driven optimization without requiring extensive corner specific datasets. Together, these chapters provide a grounded overview of current techniques and ongoing developments in automated analog IC design. 91 pp. Englisch.
Lingua: Inglese
Editore: Springer 2026
Serie: SpringerBriefs in Applied Sciences and Technology, Libro 453 di 472. Libro 453 di 472 - SpringerBriefs in Applied Sciences and Technology
- Brossura
- Print on Demand
Da: Majestic Books, Hounslow, , Regno UnitoMajestic Books
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Condizione: New. Print on Demand.
Lingua: Inglese
Editore: Springer 2026
Serie: SpringerBriefs in Applied Sciences and Technology, Libro 453 di 472. Libro 453 di 472 - SpringerBriefs in Applied Sciences and Technology
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Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios
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Condizione: New. PRINT ON DEMAND.
Lingua: Inglese
Editore: Springer Verlag GmbH 2026
Serie: SpringerBriefs in Applied Sciences and Technology, Libro 453 di 472. Libro 453 di 472 - SpringerBriefs in Applied Sciences and Technology
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Da: moluna, Greven, , Germaniamoluna
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Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt.
Lingua: Inglese
Editore: Springer, Springer Apr 2026 2026
Serie: SpringerBriefs in Applied Sciences and Technology, Libro 453 di 472. Libro 453 di 472 - SpringerBriefs in Applied Sciences and Technology
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- Print on Demand
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
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Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book delivers a focused, technical exploration of automated analog and RF integrated circuit sizing under process, voltage, and temperature variations, guiding readers through foundational concepts, current methodologies, and adva…nced machinelearningdriven approaches. It first examines multiple reinforcementlearningbased strategies for embedding PVT conditions directly into modern sizing flows, clarifying their conceptual differences and practical implications. It then explores a complementary deeplearningassisted approach that leverages ANNbased performance regressors, transfer learning, and adaptive refinement to accelerate simulationdriven optimization without requiring extensive cornerspecific datasets. Together, these chapters provide a grounded overview of current techniques and ongoing developments in automated analog IC design.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 104 pp. Englisch.
