9783211837085 - simulation of semiconductor processes and devices 2001: sispad 2001 (4 risultati)
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Da: Scissortail, Oklahoma City, OK, U.S.A.Scissortail
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EUR 128,72
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Condizione: good. This is a pre-loved book that shows moderate signs of wear from previous reading. You may notice creases, edge wear, or a cracked spine, but it remains in solid, readable condition. Please note: -May include library or rental stickers, stamps, or markings. -Supplemental materials e.g., CDs, access codes, insert…s are not guaranteed. -Box sets may not come with the original outer box. If it does, the box will not be in perfect condition. Your satisfaction is our top priority! If you have any questions or concerns about your order, please don't hesitate to reach out. Thank you for shopping with us and supporting small businessâ"happy reading.
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Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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EUR 227,37
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Condizione: New. In.
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Da: moluna, Greven, Germaniamoluna
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EUR 227,74
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Gebunden. Condizione: New.
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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EUR 283,06
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Buch. Condizione: Neu. Neuware - This volume contains the Proceedings of the International Conference on Simulation of Semiconductor Devices and Processes, SISPAD 01, held on September 5-7, 2001, in Athens.The conference provided an open forum for the presentation of the latest results and trends in process and device simulation…. The trend towards shrinking device dimensions and increasing complexity in process technology demands the continuous development of advanced models describing basic physical phenomena involved. New simulation tools are developed to complete the hierarchy in the Technology Computer Aided Design simulation chain between microscopic and macroscopic approaches. The conference program featured 8 invited papers, 60 papers for oral presentation and 34 papers for poster presentation, selected from a total of 165 abstracts from 30 countries around the world. These papers disclose new and interesting concepts for simulating processes and devices.
