Springer series in surface sciences - 9783319048635 - laboratory micro-x-ray fluorescence spectroscopy: instrumentation and applications: 55 di haschke, michael (10 risultati)

Lingua: Inglese
Editore: Springer, 2014
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Lingua: Inglese
Editore: Springer, 2014
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Lingua: Inglese
Editore: Springer, 2014
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Lingua: Inglese
Editore: Springer, 2014
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Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a µ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions.…

Lingua: Inglese
Editore: Springer, 2014
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Lingua: Inglese
Editore: Springer Verlag, 2014
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Hardcover. Condizione: Brand New. 356 pages. 9.25x6.25x1.00 inches. In Stock.

Lingua: Inglese
Editore: Springer, 2014
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Lingua: Inglese
Editore: Springer, Berlin, Springer, 2014
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Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a µ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions. 356 pp. Englisch.…

Lingua: Inglese
Editore: Springer International Publishing, 2014
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Da: moluna, Greven, Germaniamoluna
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Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Gives a description of the main instrumental influences on the analytical performanceDiscusses the different quantification models of X-ray measurements considering the special requirements to the analysis of non-homogeneous materialsSuppli.…

Lingua: Inglese
Editore: Springer, Springer Nature Switzerland Mai 2014, 2014
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Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
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Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a µ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 376 pp. Englisch.…