Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 178,54
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
Condizione: New.
Condizione: As New. Unread book in perfect condition.
EUR 211,85
Quantità: 5 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Helium Ion Microscopy | Gregor Hlawacek (u. a.) | Taschenbuch | xxiii | Englisch | 2018 | Springer | EAN 9783319824734 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Condizione: New. pp. 549.
EUR 255,74
Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. It also provides first hand information on nanofabrication and high resolution imaging. Relevant theoretical models and the existing simulation approaches are discussed in an extra section. The structure of the book allows the novice to get acquainted with the specifics of the technique needed to understand the more applied chapters in the second half of the volume. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field. This includes imaging of biological samples, resist and precursor based nanofabrication, applications in semiconductor industry, using Helium as well as Neon and many more. The fundamental part allows the regular HIM user to deepen his understanding of the method. A final chapter by Bill Ward, one of the pioneers of HIM, covering the historical developments leading to the existing tool complements the content.
EUR 382,21
Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Da: Brook Bookstore On Demand, Napoli, NA, Italia
EUR 190,30
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: new. Questo è un articolo print on demand.
Lingua: Inglese
Editore: Springer International Publishing, 2018
ISBN 10: 3319824732 ISBN 13: 9783319824734
Da: moluna, Greven, Germania
EUR 206,40
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Written by the leading professionals in the fieldHighlights the basic physics as well as the technological aspects of the instrumentPresents the relevant theoretical models and the corresponding software packagesDescribes real applic.
Lingua: Inglese
Editore: Springer International Publishing Jun 2018, 2018
ISBN 10: 3319824732 ISBN 13: 9783319824734
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
EUR 246,09
Quantità: 2 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. It also provides first hand information on nanofabrication and high resolution imaging. Relevant theoretical models and the existing simulation approaches are discussed in an extra section. The structure of the book allows the novice to get acquainted with the specifics of the technique needed to understand the more applied chapters in the second half of the volume. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field. This includes imaging of biological samples, resist and precursor based nanofabrication, applications in semiconductor industry, using Helium as well as Neon and many more. The fundamental part allows the regular HIM user to deepen his understanding of the method. A final chapter by Bill Ward, one of the pioneers of HIM, covering the historical developments leading to the existing tool complements the content. 552 pp. Englisch.
Lingua: Inglese
Editore: Springer, Springer Jun 2018, 2018
ISBN 10: 3319824732 ISBN 13: 9783319824734
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
EUR 246,09
Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. It also provides first hand information on nanofabrication and high resolution imaging. Relevant theoretical models and the existing simulation approaches are discussed in an extra section. The structure of the book allows the novice to get acquainted with the specifics of the technique needed to understand the more applied chapters in the second half of the volume. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field. This includes imaging of biological samples, resist and precursor based nanofabrication, applications in semiconductor industry, using Helium as well as Neon and many more. The fundamental part allows the regular HIM user to deepen his understanding of the method. A final chapter by Bill Ward, one of the pioneers of HIM, covering the historical developments leading to the existing tool complements the content.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 552 pp. Englisch.
Da: Majestic Books, Hounslow, Regno Unito
EUR 313,33
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. Print on Demand pp. 549.
Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 311,46
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. PRINT ON DEMAND pp. 549.