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  • Neelesh Jain

    Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing, 2019

    ISBN 10: 3330331178 ISBN 13: 9783330331174

    Da: preigu, Osnabrück, Germania

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    EUR 69,50

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    Taschenbuch. Condizione: Neu. Testing Embedded System | Neelesh Jain | Taschenbuch | 260 S. | Englisch | 2019 | LAP LAMBERT Academic Publishing | EAN 9783330331174 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.

  • Jain, Neelesh

    Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing, 2019

    ISBN 10: 3330331178 ISBN 13: 9783330331174

    Da: Buchpark, Trebbin, Germania

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    Condizione: Gut. Zustand: Gut | Seiten: 260 | Sprache: Englisch | Produktart: Bücher | The embedded systems world is a fast growing industry. The engineers who built the products perform the testing because they understood best how things were supposed to work. The embedded industry is changing fast and systems have become larger, more complex, and more integrated. Embedded systems have to rely on high quality hardware as well as high quality software. Therefore, both hardware and software testing are essential parts of the test approach for an embedded system. Software now makes up the larger part of the system, often replacing hardware. Systems that used to work in isolation are linked to provide integrated functionality. This cannot be produced by one brilliant individual anymore, but has to be an organized team effort. Similarly, the process of testing has become larger, more complex, and harder to control. It has led to a growing need for a method that helps to get the complex testing process under control. Testing is more than just exercising the system and checking if it behaves correctly. It also involves the planning of activities, designing test cases, managing the test infrastructure, setting up an organization, dealing with politics and much more.

  • Jain, Dr. Neelesh

    Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing, 2019

    ISBN 10: 3330331178 ISBN 13: 9783330331174

    Da: Revaluation Books, Exeter, Regno Unito

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    EUR 139,18

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    Paperback. Condizione: Brand New. 260 pages. 8.66x5.91x0.59 inches. In Stock.

  • Neelesh Jain

    Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing Jul 2019, 2019

    ISBN 10: 3330331178 ISBN 13: 9783330331174

    Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania

    Valutazione del venditore 5 su 5 stelle 5 stelle, Maggiori informazioni sulle valutazioni dei venditori

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    Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The embedded systems world is a fast growing industry. The engineers who built the products perform the testing because they understood best how things were supposed to work. The embedded industry is changing fast and systems have become larger, more complex, and more integrated. Embedded systems have to rely on high quality hardware as well as high quality software. Therefore, both hardware and software testing are essential parts of the test approach for an embedded system. Software now makes up the larger part of the system, often replacing hardware. Systems that used to work in isolation are linked to provide integrated functionality. This cannot be produced by one brilliant individual anymore, but has to be an organized team effort. Similarly, the process of testing has become larger, more complex, and harder to control. It has led to a growing need for a method that helps to get the complex testing process under control. Testing is more than just exercising the system and checking if it behaves correctly. It also involves the planning of activities, designing test cases, managing the test infrastructure, setting up an organization, dealing with politics and much more. 260 pp. Englisch.

  • Dr. Neelesh Jain

    Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing, 2019

    ISBN 10: 3330331178 ISBN 13: 9783330331174

    Da: moluna, Greven, Germania

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    EUR 66,32

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    Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Jain Dr. NeeleshDr. Neelesh Kumar Jain, is working as a Professor and Head, Department of Computer Applications, in Sagar Institute of Research & Technology, Bhopal, He has published seven books and has published more than 15 researc.

  • Neelesh Jain

    Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing Jul 2019, 2019

    ISBN 10: 3330331178 ISBN 13: 9783330331174

    Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania

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    EUR 82,90

    Spedizione EUR 60,00
    Spedito da Germania a U.S.A.

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    Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The embedded systems world is a fast growing industry. The engineers who built the products perform the testing because they understood best how things were supposed to work. The embedded industry is changing fast and systems have become larger, more complex, and more integrated. Embedded systems have to rely on high quality hardware as well as high quality software. Therefore, both hardware and software testing are essential parts of the test approach for an embedded system. Software now makes up the larger part of the system, often replacing hardware. Systems that used to work in isolation are linked to provide integrated functionality. This cannot be produced by one brilliant individual anymore, but has to be an organized team effort. Similarly, the process of testing has become larger, more complex, and harder to control. It has led to a growing need for a method that helps to get the complex testing process under control. Testing is more than just exercising the system and checking if it behaves correctly. It also involves the planning of activities, designing test cases, managing the test infrastructure, setting up an organization, dealing with politics and much more.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 260 pp. Englisch.

  • Neelesh Jain

    Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing, 2019

    ISBN 10: 3330331178 ISBN 13: 9783330331174

    Da: AHA-BUCH GmbH, Einbeck, Germania

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    EUR 82,90

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    Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The embedded systems world is a fast growing industry. The engineers who built the products perform the testing because they understood best how things were supposed to work. The embedded industry is changing fast and systems have become larger, more complex, and more integrated. Embedded systems have to rely on high quality hardware as well as high quality software. Therefore, both hardware and software testing are essential parts of the test approach for an embedded system. Software now makes up the larger part of the system, often replacing hardware. Systems that used to work in isolation are linked to provide integrated functionality. This cannot be produced by one brilliant individual anymore, but has to be an organized team effort. Similarly, the process of testing has become larger, more complex, and harder to control. It has led to a growing need for a method that helps to get the complex testing process under control. Testing is more than just exercising the system and checking if it behaves correctly. It also involves the planning of activities, designing test cases, managing the test infrastructure, setting up an organization, dealing with politics and much more.