ISBN: 9783540206620 - nanoscale characterisation of ferroelectric materials: scanning probe microscopy approach (10 risultati)

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  • Lingua: Inglese

    Editore: Springer, 2004

    3540206620 / 9783540206620

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    Da: Llibreria Hispano Americana, Barcelona, B, SpagnaLlibreria Hispano Americana

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    Encuadernación de tapa dura. Condizione: Nuevo. Condizione sovraccoperta: Nuevo.

  • Lingua: Inglese

    Editore: Springer, 2004

    3540206620 / 9783540206620

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    Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices

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    Condizione: New.

  • Lingua: Inglese

    Editore: Springer, 2004

    3540206620 / 9783540206620

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    Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections

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    EUR 185,46

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    Condizione: New. In English.

  • Lingua: Inglese

    Editore: Springer, 2004

    3540206620 / 9783540206620

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    Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH

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    EUR 183,30

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    Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Among the main trends in our daily society is a drive for smaller, faster, cheaper, smarter computers with ever-increasing memories. To sustain this drive the com puter industry is turning to nanotechnology as a source of new processes and func tional materials, which can be used in high-performance high-density electronic systems. Researchers and engineers have been focusing on ferroelectric materials for a long time due to their unique combination of physical properties. The ability of ferroelectrics to transform electromagnetic, thermal, and mechanical energy into electrical charge has been used in a number of electronic applications, most recently in nonvolatile computer memories. Classical monographs, such as Ferro electricity by E. Fatuzzo and W. J. Mertz, served as a comprehensive introduction into the field for several generations of scientists. However, to meet the challenges of the 'nano-era', a solid knowledge of the ferroelectric properties at the nano scale needs to be acquired. While the science of ferroelectrics from micro-to lar ger scale is well established, the science of nanoscale ferroelectrics is still terra in cognita. The properties of materials at the nanoscale show strong size dependence, which makes it imperative to perform reliable characterization at this size range. One of the most promising approaches is based on the use of scanning probe microscopy (SPM) which has revolutionized materials research over the last dec ade.…

  • Lingua: Inglese

    Editore: Springer Verlag, 2004

    3540206620 / 9783540206620

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    Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books

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    EUR 243,50

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    Hardcover. Condizione: Brand New. 1st edition. 282 pages. German language. 9.50x6.50x0.75 inches. In Stock.

  • Lingua: Inglese

    Editore: Springer, 2004

    3540206620 / 9783540206620

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    Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books

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    Condizione: Usato - Come nuovo

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    Hardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

  • Lingua: Inglese

    Editore: Springer, 2004

    3540206620 / 9783540206620

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    Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices

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    EUR 298,61

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    Condizione: As New. Unread book in perfect condition.

  • Lingua: Inglese

    Editore: Springer Berlin Heidelberg Apr 2004, 2004

    3540206620 / 9783540206620

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    Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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    EUR 160,49

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    Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior. This state-of-the-art review of theory and experiments on nanoscale polarization phenomena will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. The non-specialists will obtain valuable information about different approaches to electrical characterization by SPM, while researchers in the ferroelectric field will be provided with details of SPM-based measurements of ferroelectrics. 300 pp. Englisch.…

  • Lingua: Inglese

    Editore: Springer Berlin Heidelberg, 2004

    3540206620 / 9783540206620

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    Da: moluna, Greven, Germaniamoluna

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    EUR 136,16

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    Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First one on nanoscale characterization of ferroelectric materialsFirst one on nanoscale characterization of ferroelectric materialsIncludes supplementary material: sn.pub/extrasThis book presents recent advances in the field of nan. …

  • Lingua: Inglese

    Editore: Springer Berlin Heidelberg, Springer Apr 2004, 2004

    3540206620 / 9783540206620

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    Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000

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    EUR 160,49

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    Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Among the main trends in our daily society is a drive for smaller, faster, cheaper, smarter computers with ever-increasing memories. To sustain this drive the com puter industry is turning to nanotechnology as a source of new processes and func tional materials, which can be used in high-performance high-density electronic systems. Researchers and engineers have been focusing on ferroelectric materials for a long time due to their unique combination of physical properties. The ability of ferroelectrics to transform electromagnetic, thermal, and mechanical energy into electrical charge has been used in a number of electronic applications, most recently in nonvolatile computer memories. Classical monographs, such as Ferro electricity by E. Fatuzzo and W. J. Mertz, served as a comprehensive introduction into the field for several generations of scientists. However, to meet the challenges of the 'nano-era', a solid knowledge of the ferroelectric properties at the nano scale needs to be acquired. While the science of ferroelectrics from micro-to lar ger scale is well established, the science of nanoscale ferroelectrics is still terra in cognita. The properties of materials at the nanoscale show strong size dependence, which makes it imperative to perform reliable characterization at this size range. One of the most promising approaches is based on the use of scanning probe microscopy (SPM) which has revolutionized materials research over the last dec ade.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 300 pp. Englisch.…