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  • Lingua: Inglese

    Editore: Springer, 2006

    ISBN 10: 3540286039 ISBN 13: 9783540286035

    Da: Ria Christie Collections, Uxbridge, Regno Unito

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    EUR 676,15

    Spedizione EUR 13,85
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    Condizione: New. In.

  • Beckhoff, B. (Editor)/ Kanngiefer, B. (Editor)/ Langhoff, N. (Editor)/ Wedell, R. (Editor)/ Wolff, H. (Editor)

    Lingua: Inglese

    Editore: Springer Verlag, 2006

    ISBN 10: 3540286039 ISBN 13: 9783540286035

    Da: Revaluation Books, Exeter, Regno Unito

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    EUR 1.033,07

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    Hardcover. Condizione: Brand New. 1st edition. 863 pages. 9.00x6.25x1.50 inches. In Stock.

  • Burkhard Beckhoff

    Lingua: Inglese

    Editore: Springer Berlin Heidelberg, Springer Berlin Heidelberg, 2006

    ISBN 10: 3540286039 ISBN 13: 9783540286035

    Da: AHA-BUCH GmbH, Einbeck, Germania

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    EUR 748,99

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    Spedito da Germania a U.S.A.

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    Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - X-Ray uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained.

  • Burkhard Beckhoff

    Lingua: Inglese

    Editore: Springer Berlin Heidelberg, Springer Berlin Heidelberg Jun 2006, 2006

    ISBN 10: 3540286039 ISBN 13: 9783540286035

    Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania

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    EUR 748,99

    Spedizione EUR 60,00
    Spedito da Germania a U.S.A.

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    Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -X-Ray uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialuser sthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 904 pp. Englisch.

  • Burkhard Beckhoff

    Lingua: Inglese

    Editore: Springer Berlin Heidelberg, Springer Berlin Heidelberg Jun 2006, 2006

    ISBN 10: 3540286039 ISBN 13: 9783540286035

    Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania

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    EUR 748,99

    Spedizione EUR 23,00
    Spedito da Germania a U.S.A.

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    Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -X-Ray uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained. 904 pp. Englisch.

  • Beckhoff, Burkhard|Kanngießer, Birgit|Langhoff, Norbert

    Lingua: Inglese

    Editore: Springer Berlin Heidelberg, 2006

    ISBN 10: 3540286039 ISBN 13: 9783540286035

    Da: moluna, Greven, Germania

    Valutazione del venditore 5 su 5 stelle 5 stelle, Maggiori informazioni sulle valutazioni dei venditori

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    EUR 619,04

    Spedizione EUR 48,99
    Spedito da Germania a U.S.A.

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    Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The most comprehensive and latest&nbspcore reference&nbspin this field Makes it a must for all the analytical laboratories and individual analysts because of its user orientation The most comprehensive and latest core reference in thi.