ISBN: 9783540594109 - epioptics: linear and nonlinear optical spectroscopy of surfaces and interfaces (3 risultati)

Hardcover. Condizione: Good+. No Jacket. A little reading wear. Otherwsie a solid, unmarked volume.

Hardcover. Condizione: Very Good. An investigation into optical techniques for extracting surface and interface information with a resolution of less than a single atomic layer. These techniques have been widely applied to semiconductor surfaces and interfaces, and include polarised reflection techniques such as reflection anisotropy spectroscopy and spectroscopic ellipsometry, Raman scattering, and optical second harmonic and sum frequency generation. Epitoptics' potential in the area of growth monitoring, and in situ monitoring of semiconductor growth with submonolayer sensitivity has been demonstrated in growth reactors under normal operating conditions. The book emphasizes studies of submonolayer growth on semiconductor surfaces. Chapters include: Spectroscopic Ellipsometry Reflection Difference Techniques Raman Spectroscopy Photoluminescence Spectroscopy On the Theory of Second Harmonic Generation Second Harmonic and Sum Frequency Generation Conclusions Hardback, pp230.…

Condizione: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.