Isbn: 9783642058448 - nanoscale characterisation of ferroelectric materials: scanning probe microscopy approach (11 risultati)

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    • Lingua: Inglese

      Editore: Springer, 2010

      3642058442 / 9783642058448

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      Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH

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      Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Among the main trends in our daily society is a drive for smaller, faster, cheaper, smarter computers with ever-increasing memories. To sustain this drive the com puter industry is turning to nanotechnology as a source of new processes and func tional materials, which can be used in high-performance high-density electronic systems. Researchers and engineers have been focusing on ferroelectric materials for a long time due to their unique combination of physical properties. The ability of ferroelectrics to transform electromagnetic, thermal, and mechanical energy into electrical charge has been used in a number of electronic applications, most recently in nonvolatile computer memories. Classical monographs, such as Ferro electricity by E. Fatuzzo and W. J. Mertz, served as a comprehensive introduction into the field for several generations of scientists. However, to meet the challenges of the 'nano-era', a solid knowledge of the ferroelectric properties at the nano scale needs to be acquired. While the science of ferroelectrics from micro-to lar ger scale is well established, the science of nanoscale ferroelectrics is still terra in cognita. The properties of materials at the nanoscale show strong size dependence, which makes it imperative to perform reliable characterization at this size range. One of the most promising approaches is based on the use of scanning probe microscopy (SPM) which has revolutionized materials research over the last dec ade.

    • Lingua: Inglese

      Editore: Springer, 2010

      3642058442 / 9783642058448

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      Da: Books Puddle, New York, NY, U.S.A.Books Puddle

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      Condizione: New. pp. XIV + 282.

    • Lingua: Inglese

      Editore: Springer, 2010

      3642058442 / 9783642058448

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      Da: preigu, Osnabrück, Germaniapreigu

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      Taschenbuch. Condizione: Neu. Nanoscale Characterisation of Ferroelectric Materials | Scanning Probe Microscopy Approach | Marin Alexe (u. a.) | Taschenbuch | NanoScience and Technology | xiii | Englisch | 2010 | Springer | EAN 9783642058448 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

    • Lingua: Inglese

      Editore: Springer Berlin Heidelberg, 2010

      3642058442 / 9783642058448

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      Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books

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      EUR 244,12

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      Paperback. Condizione: Brand New. reprint edition. 296 pages. 9.00x6.00x0.71 inches. In Stock.

    • Lingua: Inglese

      Editore: Springer, 2010

      3642058442 / 9783642058448

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      Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books

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      Condizione: Usato - Come nuovo

      EUR 257,91

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      Quantità: 1 disponibili

      Paperback. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

    • Lingua: Inglese

      Editore: Springer, 2010

      3642058442 / 9783642058448

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      Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand

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      EUR 126,26

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      Condizione: new. Questo è un articolo print on demand.

    • Lingua: Inglese

      Editore: Springer Berlin Heidelberg Dez 2010, 2010

      3642058442 / 9783642058448

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      Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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      EUR 160,49

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      Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior. This state-of-the-art review of theory and experiments on nanoscale polarization phenomena will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. The non-specialists will obtain valuable information about different approaches to electrical characterization by SPM, while researchers in the ferroelectric field will be provided with details of SPM-based measurements of ferroelectrics. 300 pp. Englisch.

    • Lingua: Inglese

      Editore: Springer Berlin Heidelberg, 2010

      3642058442 / 9783642058448

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      Da: moluna, Greven, Germaniamoluna

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      EUR 136,16

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      Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First one on nanoscale characterization of ferroelectric materialsThis book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms .

    • Lingua: Inglese

      Editore: Springer, 2010

      3642058442 / 9783642058448

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      Da: Majestic Books, Hounslow, Regno UnitoMajestic Books

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      EUR 218,21

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      Condizione: New. Print on Demand pp. XIV + 282.

    • Lingua: Inglese

      Editore: Springer Berlin Heidelberg, Springer Berlin Heidelberg Dez 2010, 2010

      3642058442 / 9783642058448

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      Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000

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      EUR 160,49

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      Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Among the main trends in our daily society is a drive for smaller, faster, cheaper, smarter computers with ever-increasing memories. To sustain this drive the com puter industry is turning to nanotechnology as a source of new processes and func tional materials, which can be used in high-performance high-density electronic systems. Researchers and engineers have been focusing on ferroelectric materials for a long time due to their unique combination of physical properties. The ability of ferroelectrics to transform electromagnetic, thermal, and mechanical energy into electrical charge has been used in a number of electronic applications, most recently in nonvolatile computer memories. Classical monographs, such as Ferro electricity by E. Fatuzzo and W. J. Mertz, served as a comprehensive introduction into the field for several generations of scientists. However, to meet the challenges of the 'nano-era', a solid knowledge of the ferroelectric properties at the nano scale needs to be acquired. While the science of ferroelectrics from micro-to lar ger scale is well established, the science of nanoscale ferroelectrics is still terra in cognita. The properties of materials at the nanoscale show strong size dependence, which makes it imperative to perform reliable characterization at this size range. One of the most promising approaches is based on the use of scanning probe microscopy (SPM) which has revolutionized materials research over the last dec ade.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 300 pp. Englisch.

    • Lingua: Inglese

      Editore: Springer, 2010

      3642058442 / 9783642058448

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      Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios

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      EUR 223,96

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      Quantità: 4 disponibili

      Condizione: New. PRINT ON DEMAND pp. XIV + 282.