ISBN: 9783642121036 - measurement, modelling, and evaluation of computing systems and dependability and fault tolerance: 15th international gi/itg conference, mmb&dft 2010 essen, germany, march 2010 proceedings: 5987 (14 risultati)

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Paperback. Condizione: Brand New. 322 pages. 9.00x6.00x0.75 inches. In Stock.

Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This volume contains the papers presented at the International GI/ITG C- ference on Measurement, Modelling and Evaluation of Computing Systems and Dependability and Fault Tolerance, held during March 15 17, 2010 in Essen, Germany, hosted by the University of Duisburg-Essen. The Technical Committees of MMBand DFT coverallaspects ofperformanceand dependab- ityevaluationofsystemsincludingnetworks,computerarchitectures,distributed systems, software, fault-tolerant and secure systems. In 2010, both committees joined forces in a common conference MMB & DFT 2010. This current conf- ence was the 15th in a series of biannual conferences, initially started in 1981, with previous editions in Aachen, Dresden, Nuremberg and Dortmund. MMB & DFT 2010 received 42 submissions (37 regular papers and 5 tool descriptions) by authors from 15 di erent countries. Each regular paper was reviewed by at least three (and up to ve) Program Committee members and external reviewers; tool papers were reviewed by two reviewers. In total we - ceived 158 reviews and the ProgramCommittee decided to accept 19 full papers and 5 tool papers. TheprogramwascompletedbytwoinvitedtalksandwewerehappythatPhil Koopman from Carnegie Mellon University and Paul Kuhn from the University of Stuttgart accepted to give an invited talk at the conference.…

Condizione: New. Up-to-date resultsFast conference proceedingsState-of-the-art researchInvited Talks.- Invited Talk Mitigating the Effects of Internet Timing Faults Across Embedded Network Gateways.- Invited Talk Green IT - The Power Saving Challenge and ICT Solut.

Taschenbuch. Condizione: Neu. Measurement, Modelling, and Evaluation of Computing Systems and Dependability in Fault Tolerance | 15th International GI/ITG Conference, MMB & DFT 2010, Essen, Germany, March 15-17, 2010, Proceedings | Erwin Rathgeb (u. a.) | Taschenbuch | xi | Englisch | 2010 | Springer | EAN 9783642121036 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

Condizione: Sehr gut. Zustand: Sehr gut | Seiten: 322 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.

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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This volume contains the papers presented at the International GI/ITG C- ference on Measurement, Modelling and Evaluation of Computing Systems and Dependability and Fault Tolerance, held during March 15 17, 2010 in Essen, Germany, hosted by the University of Duisburg-Essen. The Technical Committees of MMBand DFT coverallaspects ofperformanceand dependab- ityevaluationofsystemsincludingnetworks,computerarchitectures,distributed systems, software, fault-tolerant and secure systems. In 2010, both committees joined forces in a common conference MMB & DFT 2010. This current conf- ence was the 15th in a series of biannual conferences, initially started in 1981, with previous editions in Aachen, Dresden, Nuremberg and Dortmund. MMB & DFT 2010 received 42 submissions (37 regular papers and 5 tool descriptions) by authors from 15 di erent countries. Each regular paper was reviewed by at least three (and up to ve) Program Committee members and external reviewers; tool papers were reviewed by two reviewers. In total we - ceived 158 reviews and the ProgramCommittee decided to accept 19 full papers and 5 tool papers. TheprogramwascompletedbytwoinvitedtalksandwewerehappythatPhil Koopman from Carnegie Mellon University and Paul Kuhn from the University of Stuttgart accepted to give an invited talk at the conference. 323 pp. Englisch.…

Condizione: New. Print on Demand pp. 336 Illus.

Condizione: New. PRINT ON DEMAND pp. 336.