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Da: California Books, Miami, FL, U.S.A.
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Condizione: As New. Unread book in perfect condition.
Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 60,28
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Aggiungi al carrelloCondizione: New. In.
Lingua: Inglese
Editore: Springer-Verlag 1992-01-01, 1992
ISBN 10: 3642844073 ISBN 13: 9783642844072
Da: Chiron Media, Wallingford, Regno Unito
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Aggiungi al carrelloPaperback. Condizione: New.
Condizione: New. pp. 386.
Da: Revaluation Books, Exeter, Regno Unito
EUR 80,75
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Aggiungi al carrelloPaperback. Condizione: Brand New. reprint edition. 378 pages. 6.06x5.83x0.16 inches. In Stock.
Lingua: Inglese
Editore: Springer Berlin Heidelberg, 2012
ISBN 10: 3642844073 ISBN 13: 9783642844072
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 53,49
Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Strutural Analysis of Point Defects in Solids introduces theprinciples and techniques of modern electron paramagneticresonance (EPR) spectroscopy essentialfor applications tothe determination of microscopic defectstructures. Investigations of the microscopic and electronicstructure, and also correlations with themagnetic propertiesof solids, require various multiplemagnetic resonance methods, such as ENDOR and opticallydetected EPR or ENDOR. This book discusses experimental,technological and theoretical aspects of these techniquescomprehensively, from a practical viewpoint, with manyillustrative examples taken from semiconductors and othersolids. The nonspecialist is informed about the potential ofthe different methods, while the researcher faced with thetask of determining defect structures isprovided with thenecessary tools, together with much information oncomputer-aided methods of data analysis and the principlesof modern spectrometer design.
Da: Brook Bookstore On Demand, Napoli, NA, Italia
EUR 46,22
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Aggiungi al carrelloCondizione: new. Questo è un articolo print on demand.
Lingua: Inglese
Editore: Springer, Springer Jan 2012, 2012
ISBN 10: 3642844073 ISBN 13: 9783642844072
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
EUR 53,49
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Strutural Analysis of Point Defects in Solids introduces theprinciples and techniques of modern electron paramagneticresonance (EPR) spectroscopy essentialfor applications tothe determination of microscopic defectstructures. Investigations of the microscopic and electronicstructure, and also correlations with themagnetic propertiesof solids, require various multiplemagnetic resonance methods, such as ENDOR and opticallydetected EPR or ENDOR. This book discusses experimental,technological and theoretical aspects of these techniquescomprehensively, from a practical viewpoint, with manyillustrative examples taken from semiconductors and othersolids. The nonspecialist is informed about the potential ofthe different methods, while the researcher faced with thetask of determining defect structures isprovided with thenecessary tools, together with much information oncomputer-aided methods of data analysis and the principlesof modern spectrometer design. 384 pp. Englisch.
Da: Majestic Books, Hounslow, Regno Unito
EUR 80,85
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Aggiungi al carrelloCondizione: New. Print on Demand pp. 386 165 Figures, 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 79,42
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Aggiungi al carrelloCondizione: New. PRINT ON DEMAND pp. 386.
Lingua: Inglese
Editore: Springer Berlin Heidelberg, 2012
ISBN 10: 3642844073 ISBN 13: 9783642844072
Da: moluna, Greven, Germania
EUR 48,37
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Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Strutural Analysis of Point Defects in Solids introduces theprinciples and techniques of modern electron paramagneticresonance (EPR) spectroscopy essentialfor applications tothe determination of microscopic defectstructures. Investigations.
Lingua: Inglese
Editore: Springer, Springer Jan 2012, 2012
ISBN 10: 3642844073 ISBN 13: 9783642844072
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
EUR 53,49
Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Structural Analysis of Point Defects in Solids provides a comprehensive introduction to the principles and techiques of modern electron paramagnetic resonance spectroscopy applied to the determination of microscopic defect structures. It informs the nonspecialist about the potential of the different methods, while the researcher faced with the task of determining defect structures will find here the necessary tools. The book will be useful for materials scientists working in semiconductor physics, laser physics, radiation damage, etc., and also for mineralogists and solid state chemists.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 384 pp. Englisch.