9783659134821 - LabVIEW Run Four Point Probe Device: Electrical Characterization of Semiconducting Thin Films made easy by Four Point Probe System controlled by LabVIEW di Agumba, ... (5 risultati)

Taschenbuch. Condizione: Neu. LabVIEW Run Four Point Probe Device | Electrical Characterization of Semiconducting Thin Films made easy by Four Point Probe System controlled by LabVIEW | John Agumba (u. a.) | Taschenbuch | 140 S. | Englisch | 2012 | LAP LAMBERT Academic Publishing | EAN 9783659134821 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.

Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book is a product of a fascinating research done through an attempt to find a fast and an accurate means of performing I-V measurements across a semiconducting thin film sample by use of a four point probe system that adopts a Van der Pauw symmetry. From the book, the reader will gain vast knowledge in Thin film Physics, elecronic design, computer interfacing computer automation and measurements in LabVIEW platform. The book outlines step-by-step design and fabrication procedures of the probe head and the Van der Pauw switching device. The interfacing of the Keithley SourceMeter 2400 to a LabVIEW running computer via the serial port is also explained in details. The interfacing of the Van der Pauw circuit to the Computer via the parallel port for switching of the probe tips on the sample surface is also addressed. The book further explains the deposition of Cuprous Oxide thin films on a glass substrate by sputtering technique and explores how the deposition parameters affects the I-V characteristics of these thin films. The reader is encouraged to have a keen look at each design step and carefully follow through the block diagram codes for better understanding. 140 pp. Englisch.

Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Agumba JohnAgumba is a lecturer of Physics at Pwani University. He holds a M.Sc. degree in Physics and he is now pursuing a PhD in Physics at Universitaet Freiburg, Germany. Karimi holds a PhD in Physics and is a senior lecturer at Ke.

Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book is a product of a fascinating research done through an attempt to find a fast and an accurate means of performing I-V measurements across a semiconducting thin film sample by use of a four point probe system that adopts a Van der Pauw symmetry. From the book, the reader will gain vast knowledge in Thin film Physics, elecronic design, computer interfacing computer automation and measurements in LabVIEW platform. The book outlines step-by-step design and fabrication procedures of the probe head and the Van der Pauw switching device. The interfacing of the Keithley SourceMeter 2400 to a LabVIEW running computer via the serial port is also explained in details. The interfacing of the Van der Pauw circuit to the Computer via the parallel port for switching of the probe tips on the sample surface is also addressed. The book further explains the deposition of Cuprous Oxide thin films on a glass substrate by sputtering technique and explores how the deposition parameters affects the I-V characteristics of these thin films. The reader is encouraged to have a keen look at each design step and carefully follow through the block diagram codes for better understanding.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 140 pp. Englisch.

Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This book is a product of a fascinating research done through an attempt to find a fast and an accurate means of performing I-V measurements across a semiconducting thin film sample by use of a four point probe system that adopts a Van der Pauw symmetry. From the book, the reader will gain vast knowledge in Thin film Physics, elecronic design, computer interfacing computer automation and measurements in LabVIEW platform. The book outlines step-by-step design and fabrication procedures of the probe head and the Van der Pauw switching device. The interfacing of the Keithley SourceMeter 2400 to a LabVIEW running computer via the serial port is also explained in details. The interfacing of the Van der Pauw circuit to the Computer via the parallel port for switching of the probe tips on the sample surface is also addressed. The book further explains the deposition of Cuprous Oxide thin films on a glass substrate by sputtering technique and explores how the deposition parameters affects the I-V characteristics of these thin films. The reader is encouraged to have a keen look at each design step and carefully follow through the block diagram codes for better understanding.