9783662443613 - x-ray absorption spectroscopy of semiconductors: 190 (9 risultati)
Lingua: Inglese
Editore: Heidelberg, Springer, 2015
Serie: Libro 175 di 235 - Springer Series in Optical Sciences
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Da: Antiquariat Bookfarm, Löbnitz, GermaniaAntiquariat Bookfarm
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EUR 86,23
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Hardcover. Condizione: Gut. Ex-library with stamp and library-signature. GOOD condition, some traces of use. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. C-05847 9783662443613 Sprache: Englisch Gewicht in Gramm: 550.
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Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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Condizione: New. In.
X-Ray Absorption Spectroscopy of Semiconductors
Schnohr, Claudia S. (Edited by)/ Ridgway, Mark C. (Edited by)
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Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
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EUR 155,56
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Hardcover. Condizione: Brand New. 2015 edition. 361 pages. 9.25x6.25x1.00 inches. In Stock.
Lingua: Inglese
Editore: Springer Berlin Heidelberg, 2014
Serie: Libro 175 di 235 - Springer Series in Optical Sciences
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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EUR 106,99
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Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they…form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.
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Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books
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Hardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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EUR 86,24
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Condizione: new. Questo è un articolo print on demand.
Lingua: Inglese
Editore: Springer Berlin Heidelberg Nov 2014, 2014
Serie: Libro 175 di 235 - Springer Series in Optical Sciences
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- Print on Demand
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
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Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of mater…ials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research. 380 pp. Englisch.
Lingua: Inglese
Editore: Springer Berlin Heidelberg, 2014
Serie: Libro 175 di 235 - Springer Series in Optical Sciences
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Da: moluna, Greven, Germaniamoluna
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EUR 92,27
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Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Gives a complete survey of the current state of the art of X-ray absorption spectroscopy of semiconductorsProvides an overview of a wide range of semiconductor materialsDisplays comprehensive summaries to allow the r…eader to access the grow.
Lingua: Inglese
Editore: Springer, Springer Nov 2014, 2014
Serie: Libro 175 di 235 - Springer Series in Optical Sciences
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- Print on Demand
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
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EUR 106,99
EUR 60,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases.Semiconductors are arguably our most technologically-relevant group of materials…given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society.The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials.Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 380 pp. Englisch.
