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Aggiungi al carrelloTaschenbuch. Condizione: Neu. Strain-Induced Effects in Advanced MOSFETs | Viktor Sverdlov | Taschenbuch | Computational Microelectronics | xiv | Englisch | 2016 | Springer | EAN 9783709119334 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Condizione: New. pp. 266.
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Strain is used to boost performance of MOSFETs. Modeling of strain effects on transport is an important task of modern simulation tools required for device design. The book covers all relevant modeling approaches used to describe strain in silicon. The subband structure in stressed semiconductor films is investigated in devices using analytical k.p and numerical pseudopotential methods. A rigorous overview of transport modeling in strained devices is given.
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Aggiungi al carrelloPaperback. Condizione: Brand New. reprint edition. 252 pages. 9.45x6.61x0.61 inches. In Stock.
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Aggiungi al carrelloCondizione: new. Questo è un articolo print on demand.
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Strain is used to boost performance of MOSFETs. Modeling of strain effects on transport is an important task of modern simulation tools required for device design. The book covers all relevant modeling approaches used to describe strain in silicon. The subband structure in stressed semiconductor films is investigated in devices using analytical k.p and numerical pseudopotential methods. A rigorous overview of transport modeling in strained devices is given. 268 pp. Englisch.
Lingua: Inglese
Editore: Springer Vienna, Springer Aug 2016, 2016
ISBN 10: 3709119332 ISBN 13: 9783709119334
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
EUR 160,49
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Strain is used to boost performance of MOSFETs. Modeling of strain effects on transport is an important task of modern simulation tools required for device design. The book covers all relevant modeling approaches used to describe strain in silicon. The subband structure in stressed semiconductor films is investigated in devices using analytical k.p and numerical pseudopotential methods. A rigorous overview of transport modeling in strained devices is given.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 268 pp. Englisch.
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EUR 228,50
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Aggiungi al carrelloCondizione: New. Print on Demand pp. 266.
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Aggiungi al carrelloCondizione: New. PRINT ON DEMAND pp. 266.