9783844319545 - fault-tolerant cells for nanoelectronic computing: designing the building blocks for reliable nanoelectronic systems using a hierarchical tolerant approach di martorell, ferran (9 risultati)
Lingua: Inglese
Editore: VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2011
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Da: Books Puddle, New York, NY, U.S.A.Books Puddle
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Condizione: New. pp. 148.
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Da: preigu, Osnabrück, Germaniapreigu
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Taschenbuch. Condizione: Neu. Fault-tolerant Cells for Nanoelectronic Computing | Designing the building blocks for reliable nanoelectronic systems using a hierarchical tolerant approach | Ferran Martorell | Taschenbuch | 148 S. | Englisch | 2011 | LAP LAMBERT Academic Publishing | EAN 9783844319545 | Verantwortliche Person für…die EU: BoD - Books on Demand, In de Tarpen 42, 22848 Norderstedt, info[at]bod[dot]de | Anbieter: preigu.
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Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books
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Paperback. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -New nanometric technologies hold the promise of device integration density increases of several orders of magnitude and, accordingly, an increase of system performance and functionality. However, this improved integration density c…omes at the cost of a dramatic reduction of several orders of magnitude on the device quality and, in general, on the operation reliability of circuits. The causes for this increased error rate are inherent to the device's dimensions. It is widely acknowledged that fault and defect tolerant strategies will be required in future nanoelectronic systems. This book analyzes the aggression sources causing the increased fault rates and how they affect the reliability of logic gate operation. From this analysis a new logic cell structure is designed and analyzed. The cell is proposed to be used as the building block for a hierarchical approach to fault-tolerant nanoelectronic architectures. This book will be especially useful for researchers and engineers working in the development of nanoelectronic systems. 148 pp. Englisch.
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Da: moluna, Greven, Germaniamoluna
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Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Martorell FerranF.Martorell is PhD in electronic engineering (Polytechnic University of Catalonia). He has a long experience in new technologies research from nanoelectronic technologies to asynchronou…s systems both at university .
Lingua: Inglese
Editore: VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2011
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Da: Majestic Books, Hounslow, Regno UnitoMajestic Books
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Condizione: New. Print on Demand pp. 148 2:B&W 6 x 9 in or 229 x 152 mm Perfect Bound on Creme w/Gloss Lam.
Lingua: Inglese
Editore: VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2011
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Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios
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Condizione: New. PRINT ON DEMAND pp. 148.
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Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
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Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -New nanometric technologies hold the promise of device integration density increases of several orders of magnitude and, accordingly, an increase of system performance and functionality. However, this improved integration density comes… at the cost of a dramatic reduction of several orders of magnitude on the device quality and, in general, on the operation reliability of circuits. The causes for this increased error rate are inherent to the device's dimensions. It is widely acknowledged that fault and defect tolerant strategies will be required in future nanoelectronic systems. This book analyzes the aggression sources causing the increased fault rates and how they affect the reliability of logic gate operation. From this analysis a new logic cell structure is designed and analyzed. The cell is proposed to be used as the building block for a hierarchical approach to fault-tolerant nanoelectronic architectures. This book will be especially useful for researchers and engineers working in the development of nanoelectronic systems.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 148 pp. Englisch.
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
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EUR 61,19 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - New nanometric technologies hold the promise of device integration density increases of several orders of magnitude and, accordingly, an increase of system performance and functionality. However, this improved integration density comes…at the cost of a dramatic reduction of several orders of magnitude on the device quality and, in general, on the operation reliability of circuits. The causes for this increased error rate are inherent to the device's dimensions. It is widely acknowledged that fault and defect tolerant strategies will be required in future nanoelectronic systems. This book analyzes the aggression sources causing the increased fault rates and how they affect the reliability of logic gate operation. From this analysis a new logic cell structure is designed and analyzed. The cell is proposed to be used as the building block for a hierarchical approach to fault-tolerant nanoelectronic architectures. This book will be especially useful for researchers and engineers working in the development of nanoelectronic systems.
