Isbn: 9783846552438 - timing and signal integrity issues with vlsi interconnects: in sub-nanometer designs (9 risultati)

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  • Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing, 2011

    3846552437 / 9783846552438

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    Da: Books Puddle, New York, NY, U.S.A.Books Puddle

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  • Lingua: Inglese

    Editore: Lap Lambert Academic Publishing, 2011

    3846552437 / 9783846552438

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    Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books

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    Paperback. Condizione: Brand New. 84 pages. 8.66x5.91x0.19 inches. In Stock.

  • Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing, 2011

    3846552437 / 9783846552438

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    Da: preigu, Osnabrück, Germaniapreigu

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    Taschenbuch. Condizione: Neu. Timing and Signal Integrity Issues with VLSI Interconnects | In sub-nanometer designs | Debaprasad Das | Taschenbuch | 84 S. | Englisch | 2011 | LAP LAMBERT Academic Publishing | EAN 9783846552438 | Verantwortliche Person für die EU: BoD - Books on Demand, In de Tarpen 42, 22848 Norderstedt, info[at]bod[dot]de | Anbieter: preigu.

  • Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing Nov 2011, 2011

    3846552437 / 9783846552438

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    Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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    Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book discusses the timing and signal integrity issues with VLSI interconnects in sub-nanometer designs. Starting with the basics of interconnect equivalent circuit model it describes the RLC equivalent models of interconnects, their extraction methodologies, and circuit simulation for timing and signal integrity analysis. With enormous analysis results for different technology nodes the importance of on-chip inductive effects has been discussed. The sample simulation model along with the SPICE netlist for timing and signal integrity analysis has been provided in the appendix. The book will be useful to the teachers, students, and researchers who are involved in modeling and analyzing the interconnects in future generation VLSI technology nodes. The book comprises four chapters and one appendix. 84 pp. Englisch.

  • Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing, 2011

    3846552437 / 9783846552438

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    Da: Majestic Books, Hounslow, Regno UnitoMajestic Books

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    Condizione: New. Print on Demand.

  • Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing, 2011

    3846552437 / 9783846552438

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    Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios

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    EUR 78,63

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    Condizione: New. PRINT ON DEMAND.

  • Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing, 2011

    3846552437 / 9783846552438

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    Da: moluna, Greven, Germaniamoluna

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    Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Das DebaprasadDebaprasad Das is Assistant Professor, Department of Electronics and Communication Engineering, Meghnad Saha Institute of Technology, Kolkata, India. He was a Senior Engineer at the ASIC product development centre, Texa.

  • Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing, 2011

    3846552437 / 9783846552438

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    Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH

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    Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This book discusses the timing and signal integrity issues with VLSI interconnects in sub-nanometer designs. Starting with the basics of interconnect equivalent circuit model it describes the RLC equivalent models of interconnects, their extraction methodologies, and circuit simulation for timing and signal integrity analysis. With enormous analysis results for different technology nodes the importance of on-chip inductive effects has been discussed. The sample simulation model along with the SPICE netlist for timing and signal integrity analysis has been provided in the appendix. The book will be useful to the teachers, students, and researchers who are involved in modeling and analyzing the interconnects in future generation VLSI technology nodes. The book comprises four chapters and one appendix.

  • Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing Nov 2011, 2011

    3846552437 / 9783846552438

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    Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000

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    EUR 49,00

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    Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book discusses the timing and signal integrity issues with VLSI interconnects in sub-nanometer designs. Starting with the basics of interconnect equivalent circuit model it describes the RLC equivalent models of interconnects, their extraction methodologies, and circuit simulation for timing and signal integrity analysis. With enormous analysis results for different technology nodes the importance of on-chip inductive effects has been discussed. The sample simulation model along with the SPICE netlist for timing and signal integrity analysis has been provided in the appendix. The book will be useful to the teachers, students, and researchers who are involved in modeling and analyzing the interconnects in future generation VLSI technology nodes. The book comprises four chapters and one appendix.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 84 pp. Englisch.