ISBN: 9783846554630 - approaches for hardware fault mitigation in multicore processors: resilient systems with unreliable devices (10 risultati)

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  • Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing, 2011

    3846554634 / 9783846554630

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    Da: moluna, Greven, Germaniamoluna

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  • Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing, 2011

    3846554634 / 9783846554630

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    Da: Books Puddle, Woodside, NY, U.S.A.Books Puddle

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  • Lingua: Inglese

    Editore: Lap Lambert Academic Publishing, 2011

    3846554634 / 9783846554630

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    Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books

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    Paperback. Condizione: Brand New. 192 pages. 8.66x5.91x0.44 inches. In Stock.

  • Lingua: Inglese

    Editore: Lap Lambert Academic Publishing, 2011

    3846554634 / 9783846554630

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    Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books

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    Paperback. Condizione: Brand New. 192 pages. 8.66x5.91x0.44 inches. In Stock.

  • Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing, 2011

    3846554634 / 9783846554630

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    Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books

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    paperback. Condizione: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

  • Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing Nov 2011, 2011

    3846554634 / 9783846554630

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    Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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    Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This thesis addresses one of the fundamental challenges emerging in microprocessor design, namely hardware reliability and resilience. Since inception in the 70's, microprocessors have primarily benefited from technological advancements in semiconductors fabrication allowing for an exponential increase in computing capability of chips by shrinking transistors sizes. Unfortunately, forecasts indicate that further shrinking in size will be accompanied by variability in transistor performance and reliability. This thesis proposes novel designs and enhancements to provide hardware reliability for parallel workloads. In particular, it is provided noteworthy improvements in Redundant Multi Threading (RMT) fault-tolerant approaches, as well as novel Expected Miss Ratio (EMR) model to determine the impact of hard faults on cache memories. 192 pp. Englisch.…

  • Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing, 2011

    3846554634 / 9783846554630

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    Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH

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    Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This thesis addresses one of the fundamental challenges emerging in microprocessor design, namely hardware reliability and resilience. Since inception in the 70's, microprocessors have primarily benefited from technological advancements in semiconductors fabrication allowing for an exponential increase in computing capability of chips by shrinking transistors sizes. Unfortunately, forecasts indicate that further shrinking in size will be accompanied by variability in transistor performance and reliability. This thesis proposes novel designs and enhancements to provide hardware reliability for parallel workloads. In particular, it is provided noteworthy improvements in Redundant Multi Threading (RMT) fault-tolerant approaches, as well as novel Expected Miss Ratio (EMR) model to determine the impact of hard faults on cache memories.…

  • Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing, 2011

    3846554634 / 9783846554630

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    Da: Majestic Books, Hounslow, Regno UnitoMajestic Books

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    Condizione: New. Print on Demand.

  • Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing Nov 2011, 2011

    3846554634 / 9783846554630

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    Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000

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    Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This thesis addresses one of the fundamental challenges emerging in microprocessor design, namely hardware reliability and resilience. Since inception in the 70's, microprocessors have primarily benefited from technological advancements in semiconductors fabrication allowing for an exponential increase in computing capability of chips by shrinking transistors sizes. Unfortunately, forecasts indicate that further shrinking in size will be accompanied by variability in transistor performance and reliability. This thesis proposes novel designs and enhancements to provide hardware reliability for parallel workloads. In particular, it is provided noteworthy improvements in Redundant Multi Threading (RMT) fault-tolerant approaches, as well as novel Expected Miss Ratio (EMR) model to determine the impact of hard faults on cache memories.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 192 pp. Englisch.…

  • Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing, 2011

    3846554634 / 9783846554630

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    Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios

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    Condizione: New. PRINT ON DEMAND.