9786138263340 - optimization of electrical parameters (cntfet): optimization of electrical parameters for carbon nanotube field effect transistor (cntfet) di pal, krishna (11 risultati)

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Taschenbuch. Condizione: Neu. Optimization of Electrical Parameters (CNTFET) | Optimization of Electrical Parameters for Carbon Nanotube field effect transistor (CNTFET) | Krishna Pal | Taschenbuch | Englisch | 2025 | LAP LAMBERT Academic Publishing | EAN 9786138263340 | Verantwortliche Person für die EU: SIA OmniScriptum Publis…hing, Brivibas Gatve 197, 1039 RIGA, LETTLAND, customerservice[at]vdm-vsg[dot]de | Anbieter: preigu.

Lingua: Inglese
Editore: Omniscriptum, LAP Lambert Academic Publishing, 2025
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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -In the sector of electronics, the demand for technological improvement has been steadilyincreasing. Until now, silicon has been the most popular material for addressing currentdemands. However, silicon has its own set of limits; si…licon-based integrated circuits andthe scaling of silicon MOSFET design confront issues such as tunnelling effect, gate oxidethickness impact, and so on, which has prompted the development of alternative materials.The expanding academic interest in carbon nanotubes (CNTs) as a possible new type ofelectronic material has resulted in substantial advances in CNT physics, including ballisticand non-ballistic electron transport properties. Low bias transport in a nanotube can benearly ballistic across distances of several hundred nanometers. Extended circuit-levelmodels that can capture both ballistic and non-ballistic electron transport phenomena,including elastic, phonon scattering, strain, and tunnelling effects, have been created fornon-ballistic CNT transistors. The effect of gate oxide thickness on the performance ofnon-ballistic CNTFETs was investigated in our results section. 68 pp. Englisch.

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Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - In the sector of electronics, the demand for technological improvement has been steadilyincreasing. Until now, silicon has been the most popular material for addressing currentdemands. However, silicon has its own set of limits; silicon…-based integrated circuits andthe scaling of silicon MOSFET design confront issues such as tunnelling effect, gate oxidethickness impact, and so on, which has prompted the development of alternative materials.The expanding academic interest in carbon nanotubes (CNTs) as a possible new type ofelectronic material has resulted in substantial advances in CNT physics, including ballisticand non-ballistic electron transport properties. Low bias transport in a nanotube can benearly ballistic across distances of several hundred nanometers. Extended circuit-levelmodels that can capture both ballistic and non-ballistic electron transport phenomena,including elastic, phonon scattering, strain, and tunnelling effects, have been created fornon-ballistic CNT transistors. The effect of gate oxide thickness on the performance ofnon-ballistic CNTFETs was investigated in our results section.

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Paperback. Condizione: new. Paperback. In the sector of electronics, the demand for technological improvement has been steadilyincreasing. Until now, silicon has been the most popular material for addressing currentdemands. However, silicon has its own set of limits; silicon-based integrated circuits andthe scaling of silicon MO…SFET design confront issues such as tunnelling effect, gate oxidethickness impact, and so on, which has prompted the development of alternative materials.The expanding academic interest in carbon nanotubes (CNTs) as a possible new type ofelectronic material has resulted in substantial advances in CNT physics, including ballisticand non-ballistic electron transport properties. Low bias transport in a nanotube can benearly ballistic across distances of several hundred nanometers. Extended circuit-levelmodels that can capture both ballistic and non-ballistic electron transport phenomena, including elastic, phonon scattering, strain, and tunnelling effects, have been created fornon-ballistic CNT transistors. The effect of gate oxide thickness on the performance ofnon-ballistic CNTFETs was investigated in our results section. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.

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Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
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Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -In the sector of electronics, the demand for technological improvement has been steadilyincreasing. Until now, silicon has been the most popular material for addressing currentdemands. However, silicon has its own set of limits; silico…n-based integrated circuits andthe scaling of silicon MOSFET design confront issues such as tunnelling effect, gate oxidethickness impact, and so on, which has prompted the development of alternative materials.The expanding academic interest in carbon nanotubes (CNTs) as a possible new type ofelectronic material has resulted in substantial advances in CNT physics, including ballisticand non-ballistic electron transport properties. Low bias transport in a nanotube can benearly ballistic across distances of several hundred nanometers. Extended circuit-levelmodels that can capture both ballistic and non-ballistic electron transport phenomena,including elastic, phonon scattering, strain, and tunnelling effects, have been created fornon-ballistic CNT transistors. The effect of gate oxide thickness on the performance ofnon-ballistic CNTFETs was investigated in our results section.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 68 pp. Englisch.